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Peek/Poke Functions
Leveling Settings
The last three softkeys make it possible to read from, or write to, a location
within the memory of the millimeter-wave controller.
•
{PEEK/POKE LOCATION}
written to.
•
reads data from the memory location already specified.
{PEEK TEST SET}
•
writes data to the memory location already specified.
{POKE TEST SET}
[SYSTEM] {MORE} {SERVICE FUNCTIONS} {XF TESTSET SERVICE} {LEVELING SETTINGS}
calls up the submenu shown on the right of
page.
These functions relate to detector gain calibration (see
Calibration" on page
3-34). They are intended to be used only by Agilent
service engineers.
makes it possible to specify the gain (in dB) of the
{SET GAIN (IF LEVEL)}
programmable gain portion of the level control circuit. (Perform a detector
gain calibration before selecting this function.)
makes it possible to specify the attenuator setting for the
{SET ATTN}
programmable gain portion of the level control circuit. Possible values are 0
to 133, with each increment representing 0.5 dB of attenuation.
makes it possible to specify a multiplier value for the DAC in the
{SET DAC}
programmable gain portion of the level control circuit. Possible values are
0 to 255.
specifies the memory location to be read from, or
Figure 3-22
8510XF Network Analyzer Systems 3-41
Operation
Service
on the previous
"Reset Detector Gain
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