Agilent Technologies 8510XF Operating And Service Manual page 49

Wafer Probe
Configuration
Figure 2-12
Figure 2-12 shows how the instruments are installed in the rack for the wafer
probe configuration. The test heads (which are placed on X-Y positioners
mounted to the wafer probe station) are omitted here, in order to give an
unobstructed view of the rack instruments.
Rack Diagram for Wafer Probe Configuration
Figure 2-13 shows rack cabling for the wafer probe configuration. For
cabling between the millimeter-wave controller and the test heads, see
"Controller / Test Head Interconnections" on page
Basic System Configurations
2-28.
8510XF Network Analyzer Systems 2-21
Installation