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Connector Positions
Power Supply Inputs
Illustrations
Figure 2-17
Installation
Test Heads
Test Heads
Port 1 and Port 2 are in the left and right test heads, respectively. The test
heads are placed on the work surface in front of the system rack, or (for
on-wafer measurement), on a wafer probe station.
The test heads are asymmetrical with regard to the positions of the test port
connectors. When the test heads are placed side by side, facing each other,
the Port 1 connector is set further back than the Port 2 connector.
It is usually best to position the left test head slightly forward of the right test
head, so that the test ports are in line. This reduces strain on test cables.
The test heads do not have their own power supplies; each head receives dc
power supply inputs from the millimeter-wave controller, by way of a
multi-pin interface cable.
The left test head is illustrated below; it is shown from the rear (that is, from
the point of view of the controller). The multiple-connector panel provides
connections between the test head and the controller (see
controller/test head interconnections). The single-connector panel contains
test port 1.
Left Test Head
2-26 8510XF Network Analyzer Systems
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