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Operation
Measurement Calibration
The 1.0 mm calibration kit also supports two quick calibration techniques,
which can be used in certain situations where measurement accuracy is not
critical; for details, see
"Alternative 1.0 mm Calibrations" on page
3-43.
Other coaxial calibration kits
It is possible to use other coaxial calibration kits with the 8510XF, provided
that appropriate adapters are connected to the 1.0 mm test ports. However,
this type of calibration will not cover the entire frequency range of the
8510XF.
For example, a 2.4 mm coaxial calibration kit could be used, provided that
adapters (1.0 mm to 2.4 mm) were connected to the test ports. However, this
would prevent the system from making calibrated measurements above
50 GHz.
On-wafer calibration
When the 8510XF is configured for on-wafer measurement, the calibration
process must be adapted to the accessories that are being used (including the
on-wafer calibration standards). See
"Operation Using a Wafer Probe
Station" on page
3-46.
3-8 8510XF Network Analyzer Systems
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