Basic System Configurations - Agilent Technologies 8510XF Operating And Service Manual

CAUTION
Basic System Configurations
The 8510XF can be used in either of two basic configurations, depending on
the means by which the test ports are connected to the device under test.
Coaxial measurement
This configuration is used when the device under test has
coaxial connectors. The 8510XF test ports have 1.0 mm
coaxial connectors, designed to cover a frequency range of
45 MHz to 110 GHz.
In this configuration, the test heads are placed on a work
surface which is attached to the instrument rack, slightly below
the millimeter-wave controller.
The device under test is normally connected to the test ports by
way of coaxial cables. It is also possible to connect the device
to one test port directly, and to the other test port by way of a
coaxial cable.
Do not attempt to connect a test device directly between the two test ports,
without cables. The test heads will not move freely enough to allow such a
connection to be made safely.
Wafer probe measurement
This configuration is used for on-wafer testing; each test port is
connected (through a 1.0 mm coaxial cable, or through an
adapter and another type of coaxial cable) to a wafer test
probe. Contact the manufacturer of the wafer probe station and
an Agilent office for information on the cables and adapters
needed to connect the test heads to the wafer probe station
(refer to "Contacting Agilent" on page
In this configuration, the test heads are placed on X-Y
positioners that are mounted to the wafer probe station.
It is usually best to remove the 8510C from the rack, and place
it on the work surface beside the probe station; this makes it
easier to see the network analyzer's display and to reach its
front panel controls.

Basic System Configurations

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8510XF Network Analyzer Systems 2-17
Installation