Omron V440-F User Manual page 338

ISO/IEC 15415 Symbol Quality
Output 2
ISO/IEC 15415 Symbol Quality
Output 3
ISO/IEC 15416 Symbol Quality
Output 1
ISO/IEC 15416 Symbol Quality
Output 2
ISO/IEC 15416 Symbol Quality
Output 3
ISO/IEC 29158 Symbol Quality
Output 1
ISO/IEC 29158 Symbol Quality
Output 2
ISO/IEC 29158 Symbol Quality
Output 3
V440-F C-Mount Code Reader User Manual
<K871, Output on Overall Grade, Overall Grade
Threshold, Symbol Contrast, Symbol Contrast
Threshold, Modulation, Modulation Threshold,
Reflectance Margin, Reflectance Margin Threshold,
Fixed Pattern Damage, Fixed Pattern Damage
Threshold, Axial Nonuniformity, Axial Nonuniformity
Threshold, Grid Nonuniformity, Grid Nonuniformity
Threshold, Unused ECC, Unused ECC Threshold>
<K872, Output on Overall Grade, Overall Grade
Threshold, Symbol Contrast, Symbol Contrast
Threshold, Modulation, Modulation Threshold,
Reflectance Margin, Reflectance Margin Threshold,
Fixed Pattern Damage, Fixed Pattern Damage
Threshold, Axial Nonuniformity, Axial Nonuniformity
Threshold, Grid Nonuniformity, Grid Nonuniformity
Threshold, Unused ECC, Unused ECC Threshold>
<K880, Output on Overall Grade, Overall Grade
Threshold, Edge Determination, Edge Determination
Threshold, Decode, Decode Threshold, Contrast,
Contrast Threshold, Min Reflectance, Min Reflectance
Threshold, Min Edge Contrast, Min Edge Contrast
Threshold, Modulation, Modulation Threshold, Defects,
Defects Threshold, Decodability, Decodability
Threshold, Quiet Zone, Quiet Zone Threshold >
<K881, Output on Overall Grade, Overall Grade
Threshold, Edge Determination, Edge Determination
Threshold, Decode, Decode Threshold, Contrast,
Contrast Threshold, Min Reflectance, Min Reflectance
Threshold, Min Edge Contrast, Min Edge Contrast
Threshold, Modulation, Modulation Threshold, Defects,
Defects Threshold, Decodability, Decodability
Threshold, Quiet Zone, Quiet Zone Threshold >
<K882, Output on Overall Grade, Overall Grade
Threshold, Edge Determination, Edge Determination
Threshold, Decode, Decode Threshold, Contrast,
Contrast Threshold, Min Reflectance, Min Reflectance
Threshold, Min Edge Contrast, Min Edge Contrast
Threshold, Modulation, Modulation Threshold, Defects,
Defects Threshold, Decodability, Decodability
Threshold, Quiet Zone, Quiet Zone Threshold >
<K890, Output on Overall Grade, Overall Grade
Threshold, Cell Contrast, Cell Contrast Threshold, Cell
Modulation, Cell Modulation Threshold, Fixed Pattern
Damage, Fixed Pattern Damage Threshold, Axial
Nonuniformity, Axial Nonuniformity Threshold, Grid
Nonuniformity, Grid Nonuniformity Threshold, Unused
ECC, Unused ECC Threshold>
<K891, Output on Overall Grade, Overall Grade
Threshold, Cell Contrast, Cell Contrast Threshold, Cell
Modulation, Cell Modulation Threshold, Fixed Pattern
Damage, Fixed Pattern Damage Threshold, Axial
Nonuniformity, Axial Nonuniformity Threshold, Grid
Nonuniformity, Grid Nonuniformity Threshold, Unused
ECC, Unused ECC Threshold>
<K892, Output on Overall Grade, Overall Grade
Threshold, Cell Contrast, Cell Contrast Threshold, Cell
Modulation, Cell Modulation Threshold, Fixed Pattern
Damage, Fixed Pattern Damage Threshold, Axial
Nonuniformity, Axial Nonuniformity Threshold, Grid
Nonuniformity, Grid Nonuniformity Threshold, Unused
ECC, Unused ECC Threshold>
Appendices
H
H-3