JEOL JSM-IT200 Instructions Manual page 76

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Map analysis condition (Element map)
Name
Process time
Resolution
Dwell time
Stopping condition
Value
Identification
Net counts map
Live time scan
Real-time filter
Probe tracking
4-6
Set the process time of the EDS detector.
Same as rate：Measure with process time specified in the rate monitor.
T1～T4：Measure the specified process time.
Generally, T3 or T2 is used for map measurement.
Set the resolution of element map.
64×48、128×96、256×192、512×384、1024×768、
2048×1536、4096×3072
Set the measurement time per one pixel.
Set conditions for stopping the measurement.
Endless：Measurement is continued until the user stops measuring.
Acquiring frames：Measure frame specified by stop condition.
Maximum counts：Measurement is performed until the count value of pixel in all element
maps reaches the count value specified by the stop condition.
Set the value of each measurement stopping condition.
Set conditions for identification analysis during measurement.
Auto：Perform automatic identification analysis periodically. The automatically detected
elements are displayed on spectrum and periodic table.
Manual ： The specified element is displayed from the beginning in spectrum and periodic
table.
Select Element：Select element from periodic table.
Set whether to create net count map at the same time as measurement.
ON：Create net count map at the same time as measurement.
OFF：Net count map is not created.
Conditions：Set the calculation method of net count map.
Calculate the dwell time with live time, and measure.
ON：Enables live time scan.
Because measurement is performed by live time, the measurement time will be longer
by about the dead time.
OFF：Disable live time scan.
Set filter to be applied to the map image during measurement.
Set conditions for probe tracking.
ON：Perform probe tracking at the set time interval.
OFF：Probe tracking is not performed.
Description
No.ISMIT200-1E