JEOL JSM-IT200 Instructions Manual page 534

Index Term
L
Liner Tube
Live Time
Live Analysis
Live Image
Line Scan Profile
Line Analysis
Label
Lens
Lens Reset
M MAIN POWER Key Switch
Movie
Measurement
Movable aperture (option)
Move to Previous
Magnification
Multiple Analyses
Multiple Display
Mapping
13-10
Description
A column set on the electron beam path in the magnetic lens. By using
the liner tube as a vacuum barrier, parts that emit a lot of gas, such as the
lens coil, scan coil, deflection coil, and stigmator, can be placed outside
of the vacuum, which reduces contamination in the column. By setting a
fixed aperture in the liner tube, this part can be easily removed from the
column, and makes maintenance simple.
This is the available measuring time for the EDS detector. This is the net
measuring time calculated by subtracting the actual measuring time from
the dead time. In EDS analysis, live time is the standard for measuring
time.
A function that is performed at the same time as spectrum analysis during
observation. In the IT200, the main components of the elements acquired
with the viewing area spectrum and qualitative analysis are displayed on
the viewing screen.
An image of the general viewing state. A state in which the electron beam
scans the surface of the specimen while the image on the screen
refreshes at the same time.
Displays the image brightness as lines. It is used to search for saturation
points when heating the filament.
A one dimension distribution of elements can be obtained by scanning a
specified straight line with an electron microscope and measuring the
characteristic X-ray spectrum for each pixel. This is effective for
examining detailed element distribution of an interface. It can be used
when highly accurate analysis greater than map analysis for trace
elements and the like is required.
The name of the position to input text of photo data and input window.
In electric or ion optical systems, a lens forces the electrons or ions
emitted or diffused from the object plane of the optical axis toward the
optical axis by using the magnetic or electric field (or electric and
magnetic crossed fields) of the curved axial symmetry and re-converges
them at one point on the axis (image surface). Strictly speaking, the
aberrations on the lens do not converge the electrons or ions into one
point. A lens that adjusts the irradiation current and contraction ratio is
called a condenser lens, and is placed at the final EOS phase. A lens that
creates a scan spot on the specimen is called an objective lens.
In order to correct differences in current caused by hysteresis, this
function returns the values that were set for the condenser lens and
objective lens current to the original values.
The key switch to turn the SEM power on or off.
This icon to plays, saves or starts saving videos. See "Video Saving."
The generic term for Height, Area, Angle, and other measurement
functions as well as the name of the icon that displays measurement
function buttons.
A unit that can switch between multiple apertures for different diameters
to suit the application.
Moves from the current coordinate position to the previous position. Also
the name of the icon that starts the function.
The ratio of the actual size and enlarged size of the specimen being
viewed. There are two types of display methods: picture magnification
and display magnification.
The name of the button used to switch to the mode that sequentially
performs point and area analyses in the IT200 Series.
The state in which two screens are displayed on the UI and the name of
the icon that displays two screens on the UI.
In the IT200 Series, one image can displayed in different signals.
The electron probe scans a specimen in two dimensions to acquire data
from a specimen and display the acquired results in two dimensions. It is
used in order to learn about two dimensional distribution of elements or
crystal orientation.
No. ISMIT200-1E