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JEOL JSM-IT200 Instructions Manual page 162

Scanning electron microscope

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Slow
You can select from among 3 combinations of speed & resolution.
Tick CF Scan, specimen charge-up can be reduced.
Photo
1 Frame:
Integration:
Tick CF Scan, specimen charge-up can be reduced.
Disable Contrast, Brightness and Suppress during Photo acquisition
Check:
Contrast, Brightness and Suppress cannot adjust during Photo acquisition
Open:
Contrast, Brightness and Suppress can adjust during Photo acquisition
Wobbler
When the amount of irradiation current (PC) is small, an image moves smoothly by increasing the "Frame
Integration Coefficient", and the adjustment of movable aperture becomes easy.
(Selectable range 1 to 16)
No.ISMIT200-1E
Select from among 7 combinations of speed & resolution.
Select from among 5 combinations of speed & resolution.
This is effective with specimens likely to be charged up.
The Frame Integration Coefficient can be set according to the level of charge-up.
5-33

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