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JEOL JSM-IT200 Instructions Manual page 532

Scanning electron microscope

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Index
Term
H
HUB
High Vacuum Mode
Horizontal (Changes)
Horizontal Scan Correction
Horizontal Stage Correction
Halation
Hysteresis
Histogram
Home
Holder (Orifice)
Holder Mount
I
Image Shift
Image Shift Coil
Instant
Instant Analysis
Integration
Irradiation System
K
KLM Marker
K Ratio
Keystone Correction
13-8
Description
A device for consolidating multiple cables connected to each node in a
network.
This mode sets the specimen chamber to the order of 10-2 to 10-3 Pa
and the electron gun chamber pressure to 10-3 Pa or lower, and views
the specimen with an ET detector or semiconductor BSE detector by
evacuating the electron gun and specimen chamber almost concurrently
with a high vacuum evacuation.
Refers to horizontal correction (X, Y) for gun alignment.
This function corrects the target object horizontally with a straight line
drawn on the viewing screen.
By rotating the scan with the center of the drawn line fixed, the target
object is corrected horizontally.
This function corrects the target object horizontally with a straight line
drawn on the viewing screen.
The center of the drawn line is moved to the center of the view screen
and the target object is corrected horizontally by rotating the stage R
drive.
This is the spreading of white light beyond its proper boundaries in
images in which secondary electrons are emitted highly efficiently on the
edge of specimens in secondary electron images and the like.
This is a phenomenon in magnetic material that has an excitation coil like
an electromagnetic lens, and after changing the excitation current for
magnetic flux density that occurs in a magnetic substance when the
desired excitation current, the magnetic flux density inside the magnetic
substance is not the same value even if the original excitation current is
restored. Even if the same focus current is applied to the objective lens,
as the same focus will not be able to be obtained due to the excitation
current conditions before and after, an operation called a lens reset that
cancels the difference in magnetic flux density in the magnetic substance.
This function separates the darkest and lightest areas of the image in
multiple stages, and displays how many bright areas are on the image on
a graph. It is also the name of the icon that displays the function.
A tab on the UI.
Select this tab to display a list of the most-used icons.
The same definition as Aperture Holder (Orifice).
The part where the specimen is placed on the stage inside the specimen
chamber.
A system to electronically move the field of view (using the image shift
coil). Enabled when minutely moving the field of view in high
magnification.
An electromagnetic coil installed to perform image shift.
A scan mode. Used to shoot images at high speed and does not require a
high resolution like a photo.
Analyze one point of a specimen on a spectrum only while clicking. As
measurement starts as soon as the button is clicked, this is used as a
pre-check before analyzing the area.
Stacking and averaging images.
The same definition as EOS. See "EOS."
A linear marker displayed on a spectrum to identify peaks, it displays the
energy position for the characteristic X-ray (K, L, and M rays) and
intensity ratios for the alpha and beta rays.
The ratio of the X-ray intensity of an unknown specimen against the X-ray
intensity of a standard specimen. The same definition as relative
intensity.
This function corrects magnification misalignments above and below the
viewing screen caused by specimen tilt. It is also the name of the icon
that starts the function.
No. ISMIT200-1E

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