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From Figure 30
FLT Load to Cycle Tests
QY310 - FBO
Scan-In Kerne
I
Scan-In Test Woods
(l -11) to CPU
QYll 0 F4E
Fetch LCW Kernel
12th Test Word to SDR
QYll 0 - FBB
Execute LCW Kernel
Set Various Stats, Seq Ctr,
and ROAR (NOTE 3)
Hardware
r---------------- -- - - -
-----1
I
I
I
I
I
I
I
L
Clock
Adv:~c~-----1
(Execute ROS Word)
Increment Seq Ctr
--·-1
· · · - - - - -
Force ROAR Adr (2CO)
Reset SS and S ESS
I
__J
I
I
I
I
I
L ___ _
--------j------------
_J
QY410-2CO
Scan-Out Kernel
Fetch ond Store 13th Test Word
(Actua I Response Adr to Loe 80)
I
QY410-F17
Scan-Out Kernel
Fetch and Store 14th Test Word
(Mask Adr to Loe 84)
1
Scan- Out Kernel
QY410- F26
Scan-Out 32 Words
QY420- F09
Starting at Loe 88
QY430-FC6
j
QY510-F45
I
Figure 33
FLT Compare and Branch
Kernel
j
QY310-F48
Resd Bin Tgr and Error
Reg. Branch Back to First
Word of Desired Test
NOTES:
1
1. See Figure 15 for details on all kernels except the FLT compare
and branch kernel (Figure 33).
2. See Figure 31 for word format of FLT eye le tests.
3. FLT's ta date(EC level 255452)always set the SS--an, PSS--off,
and the SESS--off.
FIGURE 32. FLT ZERO/ ONE-CYCLE TESTS
in storage hex address 088-0BC. Channel status
(17 words) is stored in hex addresses OC0-104.
See Figure 12 for details. When scan-out is com-
plete, the compare and branch kernel is entered.
FLT Compare and Branch
The FLT compare and branch kernel compares the
ac~ual
response with the expected response and sets
the pass/fail triggers on the results. At the same
time, the scan test counter is stepped up by one and
a return to the beginning of the current test (scan-in)
is made. This occurs 16 times except for the 16th
pass which goes to the branch section of the kernel
instead of returning to the beginning of the current
test. See Figure 33, FLT Compare and Branch
Kernel.
In
the branch section of the kernel, both the pass
and fail triggers are tested. The fail trigger will be
on
if
the OR'ed result of the mask and actual re-
sponse was different than the expected response for
any of the 16 passes. The pass trigger will be on
if
the OR 'ed result of the mask and actual response
was the same as the expected response for any of the
16 passes.
If
a test both passes and fails during
execution, the machine stops after the 16th pass with
both the pass and fail triggers on, thus indicating an
intermittent failure has occurred.
If
both the pass and fail triggers are off at the
end of the 16 passes, the machine stops. This con-
dition indicates a failure in the checking circuits
with a return to the ROS mode hardcore tests advis-
able. Pressing the start PB on this stop will force
a pass to the next test even though the FLT mode
switch is not on the force pass position.
FLT OPERATING/REPAIR PROCEDURES
This section contains the operating and repair proce-
dures for running FL T's from tape or disk. Note
that the main storage ripple test is always performed
before attempting to run FLT's.
For convenience,
the operating procedures for tape and disk are
SE'!)-
arated. As repair procedures are the same for both
tape-and disk-originating FLT's, no distinction is
made between the two.
Figure 34 shows the FLT run and repair proce-
dures for main store mode and ROS mode tests.
Figure 35 is a cycle test repair procedure.
FLT' s are run in the following sequence only after
the main storage ripple test has been run successfully:
1. Main store mode hardcore tests
2. Main store mode ROS bit tests
3. ROS mode hardcore tests
4. ROS mode cycle tests
Note: Disable ROS retry by jumpering01C-
E3C4Dll to a D08 pin before running or biasing
FLT's, diagnostics, or progressive scan.
Maintenance Features
(3/71)
53
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