AT&T 3B2 Off-Line Diagnostic Manual page 188

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Phase Descriptions - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - -
Test Number:
Function:
Procedure:
2
This test checks the integrity of the WE 32XOO registers using test patterns.
Generate data test patterns that are moved through the registers to verify that
each bit in each register can be set to a one and a zero and can be moved from
register to register via the internal buses.
The Register Test is divided into two parts to allow the registers that contain
such items as stack pointers to be restored at the completion of the test. The
first part of the test will test registers 1 through 8. The second part of the test
will test the FP, AP, SP, PCBP, and ISP registers.
Hardware Tested:
The WE 32XOO Microprocessor is tested.
Data Returned:
The failing test number (last number displayed on the system console prior to
failure) is returned.
Notes:
Patterns for the Register Tests are obtained by shifting until the N bit in the
condition code is set.
Test Number:
3
WE 32XOO
15 General Purpose Registers
Privilege Registers
R14 Interrupt Stack Pointer (ISP)
R13 Process Control Block Pointer (PCBP)
Rll Processor Status Word (PSW)
Noted Registers
R12 Stack Pointer (SP)
RIO Argument Pointer (AP)
R9 Frame Pointer (FP)
R8 - RO General Registers
Function:
This tests checks the logical shift left instructions.
Procedure:
Test all values of shift amount for word, half word, and byte.
Hardware Tested:
The WE 32XOO Microprocessor is tested.
Data Returned:
The failing test number (last number displayed on the system console prior to
failure) is returned.
Notes:
None
4-6 OFF-LINE DIAGNOSTIC MANUAL

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