Agilent Technologies E5500A User Manual page 355

Ste Parameters
p
3 Block Diagram Tab
• Noise Source
4 Test Set Tab
Input Attenuation
LNA Low Pass Filter
• LNA Gain
• DC Block
• PLL Integrator Attenuation
5 Graph Tab
• Title
• Graph Type
• X Scale Minimum
• X Scale Maximum
• Y Scale Minimum
• Y Scale Maximum
• Normalize trace data to a:
• Scale trace data to a new
carrier frequency of:
• Shift trace data DOWN by:
• Trace Smoothing Amount
• Power present at input of DUT
Agilent Technologies E5500 Phase Noise Measurement System 14-5
Baseband Noise Measurement Examples
Baseband Noise using a Test Set Measurement Example
Data
• Test Set Noise Input
• 0 dB
• 20 MHz (Auto checked)
• Auto Gain (Minimum Auto Gain - 14 dB)
• Not checked
• 0 dBm
• Baseband using the Agilent/HP 70420A Test Set
• Baseband Noise (dBV)
• 10 Hz
• 100 E + 6 Hz
• 0 dBc/Hz
• - 200 dBV/Hz
• 1 Hz bandwidth
• 1 times the current carrier frequency
• 0 dB
• 0
• 0 dB