GE LOGIQ E9 Service Manual page 241

GE
D 5573152-100, R
IRECTION
7-5-8-3 GFI (cont'd)
Name: GFE Access Test
Description: Reads the version of the GFE FPGA
Run Time: 00:01
If this test failed:
1.) Replace the GFI board.
Name: Relay LVDS Test
Description: Tests the LVDS connection between the GFI interface and the GRLY
Run Time: 00:02
If this test failed:
1.) Swap GFI boards and/or GRLY board to determine which board has failed.
2.) Replace the failed board.
Name: GFI Fan Test
Description: Test Front End card rack fan control and fan speed measurements
Run Time: 00:40
If this test failed:
1.) Check fan drawer in Front End Card Rack. Verify connection with backplane. Replace defective fan.
2.) Replace GFI board.
Name: GFI GTX Test
Description: Test communication with the GTX Board. (Same as the GFI Memory Test)
Run Time: 00:03
If this test failed:
1.) Based on failure information, replace the failed GTX or swap the GTX boards to isolated failure.
Name: GFI Fixed Demod Test
Description: GFI Fixed Demodulator signal path test. (Similar to the FDEMOD test with a slight variation
on how the test is run.)
Run Time: 00:03
If this test failed:
1.) Replace the GFI board.
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Chapter 7 Diagnostics/Troubleshooting
LOGIQ E9 S M
ERVICE ANUAL
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