GE LOGIQ 200 Quality Assurance Manual page 152

GE MEDICAL SYSTEMS
REV 0
2--3--2 System Diagnosis (Continued)
RESULT CODE
430
431
432
433
434
435
436
437
438
439
440
441
442
443
444
445
446
447
600
601
810
811
812
813
814
815
Caution for Use System Diagnosis Test
Restricted conditions : Connect the Probe before performing the system diagnosis, and have to remain the probe dur-
ing the system diagnosis.
BOARD
MSTE
PIOP
LOGIQ 200 PRO Series PROPRIETARY MANUAL
Meaning
Application ROM checksum test is failed.
ROM data Checksum test is failed.
Probe Data Checksum test is failed.
Setup Data test is failed.
Key history data test is failed.
500 Patient test is failed.
Reserved Flash Memory test is failed.
Real Time Clock IC test is failed.
System DRAM Test.
386EX Timer test is failed.
386EX COM1 Port test is failed.
Super I/O Basic test is failed.
Super I/O COM1 Port is failed.
Super I/O COM2 Port is failed.
Super I/O Parallel Port is failed.
VRAM test is failed.
AGDC test is failed.
MOD read/write test is failed.
PIOP test is failed.
PIOP is not connected.
Analog +5V exceed the min/max limitation.
Analog --5V exceed the min/max limitation.
Digital +5V exceed the min/max limitation.
+12V for Monitor exceed the min/max limitation.
+12V for ECG exceed the min/max limitation.
--12V for ECG exceed the min/max limitation.
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DIAGNOSTICS