GE LOGIQ 200 Quality Assurance Manual page 113

GE MEDICAL SYSTEMS
REV 1
2–3–2 System Diagnosis (Continued)
TEST NAME
SYSTEM TEST
BEAM FORMER TEST
HV TEST
ADC TEST
DSC FRONT/END TEST
B MODE FUNCTION TEST
B MODE X–Y MEMORY TEST
B MODE CINE TEST
M MODE FUNCTION TEST
MST TEST MST TEST
KEYBOARD TEST
PIOP TEST
MONITOR TEST
POWER SUPPLY TEST
There are two kinds of failure codes in B–Mode Cine test. In case of single memory fault, the
failure code 330~332 is displayed. The other failure case, the failure code 336~337 is appeared
because one frame image data is saved in both memories.
TABLE 2–1
SYSTEM DIAGNOSIS TEST LIST
TEST DETAIL
DSC Interpolation test
DSC coordination test
DSC ALM test
M–Mode Control Circuit
Battery for back up
SCSI controller
RAM for Battery backup
Real Time Clock
Counter (8253)
RS232C
Graphic Controller
SYSTEM DRAM TEST
Application ROM Check Sum
OS ROM
Note
2–12
a
LOGIQ 200 PROPRIETARY MANUAL
TEST TYPE FAILURE CODE
–
AUTO
–
MANUAL
211
AUTO
–
MANUAL
311, 312
AUTO
321
AUTO
322
AUTO
323
AUTO
324
AUTO
330~340
AUTO
341~344
AUTO
411
AUTO
412
AUTO
413
AUTO
414
AUTO
415
AUTO
417
AUTO
419, 420
AUTO
416
AUTO
AUTO 418
AUTO 421
–
MANUAL
600
AUTO
–
MANUAL
801-6
AUTO
2138854
DIAGNOSTICS