Rotate Pattern Test; How The Rotate Pattern Test Works - Agilent Technologies E5900B User Manual

Testing Target System Memory
Memory Test Patterns

Rotate Pattern test

The Rotate Pattern test finds data bits in memory that are stuck high or low. It
also detects data lines that may be tied to power ground, or not connected at
all. This test can be used to test voltage and ground bounce problems
associated with the selected memory range.

How the Rotate Pattern test works

This test writes the Pattern and the complement of the Pattern to the
Memory Range, and then compares the values in memory with what was
written. Next, the rotated Pattern and the rotated complement of the Pattern
are written, read, and compared. Now the Pattern is rotated again, and again
it is written, read, and compared. This continues until the rotations of the
pattern return it to its original arrangement. That constitutes one Repetition
of the Rotate Pattern test.
Example:
First
Address Write/Read
00000000 01
00000001 FE
00000002 02
00000003 FD
00000004 04
00000005 FB
00000006 08
00000007 F7
00000008 10
Larger Access Size selections take more time because they require more
patterns to be written to all locations (2-byte Access Size requires writing 32
patterns, and 4-byte Access Size requires writing 64 patterns).
The Access Size you select will affect the appearance of memory when you
view memory after a test. When a test is complete, memory contains the last
set of patterns that was written to it.
96
Second Third
Write/Read Write/Read
FE
02
FD
04
FB
08
F7
10
EF
Emulation for the Motorola M•CORE
02
FD
04
FB
08
F7
10
EF
20