Memory Tests - Agilent Technologies E5900B User Manual

Memory Test Patterns
You can use the memory test feature of the emulation probe to perform seven
different types of tests. Use these tests to find problems in address lines, data
lines, and data storage. Use these tests in combination because no single test
can perform a complete evaluation of the target system memory.
The emulation probe provides the following memory tests:
• Basic Pattern - to validate data read-write lines.
• Address Pattern - to validate address read-write lines.
• Rotate Pattern - to validate data read-write lines, and test voltage and
ground bounce.
• Walking Ones - to validate individual storage bits in memory.
• Walking Zeros - to validate individual storage bits in memory.
• Oscilloscope Read - to generate the signals associated with reading from
memory so they can be viewed on an oscilloscope.
• Oscilloscope Write - to generate the signals associated with writing to
memory so they can be viewed on an oscilloscope.
Emulation for the Motorola M•CORE
Testing Target System Memory
Memory Test Patterns
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