Leuze electronic CML 720i Ex Operating Instructions Manual page 77

Analog device settings (group 12)
In this group, various parameters can be used to set the analog device configurations, e.g, the
configuration of the analog output level and how the evaluation function that is represented on
the analog output is selected.
Parameter
Signal level
Evaluation function
Analog Function
Start beam for analog
measurement range
End beam for analog
measurement range
Autosplitting (group 13)
In this group, it is possible to split all logical beams into areas of identical size. The fields of areas
01 ... 32 are thereby automatically configured.
Leuze electronic
Index Sub- Data type
index
88 0 unsigned 8
89 0 record 48 bit,
isolated
access to
sub-index not
possible
89 1 unsigned 8
(bit
offset
= 40)
89 2 unsigned 16
(bit
offset
= 16)
89 3 unsigned 16
(bit
offset
= 16)
Starting up the device - IO-Link interface
Access Value range Default Explanation
RW 0 ... 6 0
RW
RW 0 ... 6 0
RW 1 ... 1774 1
RW 1 ... 1774 1
CML 720i Ex
Configuration of the analog output level: voltage:
0 ... 5 V voltage: 0 ... 10 V voltage: 0 ... 11 V cur-
rent: 4 ... 20 mA current: 0 ... 20 mA current:
0 ... 24 mA
0: Not active
1: Voltage: 0 ... 5 V
2: Voltage: 0 ... 10 V
3: Voltage: 0 ... 11 V
4: Current: 4 ... 20 mA
5: Current: 0 ... 20 mA
6: Current: 0 ... 24 mA
Selection of the evaluation function that is repre-
sented on the analog output: first interrupted/not
interrupted beam (FIB/FNIB), last interrupted/not
interrupted beam (LIB/LNIB), total of interrupted/
not interrupted beams (TIB/TNIB)
0: No evaluation (NOP)
1: First interrupted beam (FIB)
2: First not interrupted beam (FNIB)
3: Last interrupted beam (LIB)
4: Last not interrupted beam (LNIB)
5: Total of interrupted beams (TIB)
6: Total of not interrupted beams (TNIB)
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