Leuze electronic CML 720i Ex Operating Instructions Manual page 71

Parameter
Counting direction
Smoothing
Inverted smoothing
Extended settings (group 5)
The extended settings specify the filter depth, integration time (hold function) and button lock on
the receiver control panel.
Parameter
Extended settings
Filter depth
Integration time
Button lock and display
Process data settings (group 6)
The process data settings describe the cyclically transmitted process data.
The process data extension permits the serial output of the individual pieces of beam data. Each individual
beam can be processed and transferred as a bit independent of measurement field length, resolution and
beam mode (beginning with firmware version v2.10).
NOTICE
A maximum of 256 beams can be processed as a bit!
 The IO-Link specification only permits 32 bytes as process data; i.e., up to 256 beams can each be
processed and transmitted as a bit.
 Through the limitation of the process data length, the beams, depending on the resolution, can only
be processed and transmitted up to a certain measurement field length as a bit.
Leuze electronic
Index Sub- Data type
index
71 2 unsigned 8
(bit
offset
= 16)
71 3 unsigned 8
(bit
offset
= 8)
71 4 unsigned 8
(bit
offset
= 0)
Index Sub- Data type
index
74 0 record 32 bit,
isolated
access to
sub-index not
possible
74 2 unsigned 8
(bit
offset
= 16)
74 3 unsigned 8
(bit
offset
= 0)
78 0 unsigned 8
Starting up the device - IO-Link interface
Access Value range Default Explanation
RW 0 ... 1 0
RW 1 ... 255 1
RW 1 ... 255 1
Access Value range Default Explanation
RW
RW 1 ... 255 1
RW 0 ... 65535 0
RW 0 ... 1 0
CML 720i Ex
0: Normal - beginning at the connection side
1: Inverted – beginning opposite the connection
side
Smoothing:
Less than i interrupted beams are ignored.
Inverted smoothing:
Less than i free beams are ignored.
The filter depth indicates the necessary number of
consistent beam states before the evaluation of the
measurement values. The filter depth corresponds
to the number of passes with interrupted beam so
that the result leads to switching.
All measurement values are accumulated and
retained over the duration of the integration time.
Hold function in ms.
Lock operational controls on the device.
0: Enabled
1: Locked
71