Swept Sine Measurements -Option 1D2; Arbitrary Waveform Source-Option 1D4 - Agilent Technologies 35670A Service Manual

Agilent 35670A
Swept Sine Measurements —Option 1D2
Dynamic range
Default span: 51.2 Hz to 51.2 kHz
Fast average ON, 101 point log sweep
Tested with 11 dBVrms source level at 100 ms
integration (approximately 60 second sweep)
Arbitrary Waveform Source—Option 1D4
Amplitude Range
Record Length
Depends on measurement resolution (100,
200, 400, 800, and 1600 lines)
Point spacing
DAC Resolution
0.2828 Vpk to 5 Vpk
<0.2828 Vpk
Swept Sine Measurements —Option 1D2
130 dB typical
Arb: ±5 Vpk †
dc: ±10 V †
† V +|Vdc| ≤10 V
pk
# of points = 2.56 x lines of resolution, or # of
complex points = 1.28 x lines of resolution
Matches the measurement sample rate.
2.5 mV
0.25 mV
Specifications
1-15