Agilent Technologies 35670A Service Manual page 211

Failing Self Test
Input A-Wt Filter
one channel or channel 1 and
3 or channel 2 and 4
Input A-Wt Filter
all channels
Input AAF/Bypass
one channel or
channel 1 and 3 or
channel 2 and 4
Input AAF/Bypass
all channels
†
Input ICP Source
one channel or
channel 1 and 3 or
channel 2 and 4
‡
Tachometer
Source Filter
Source DC
Quick Confidence
All self tests pass
Agilent 35670A
Self-Test Troubleshooting Guide (continued)
Probable Faulty Assembly
A1/A2 Input
A6 Digital
A1/A2 Input
A6 Digital
A1/A2 Input
A6 Digital
A10 Rear Panel
A5 Analog
A5 Analog
A1/A2 Input
A5 Analog
A6 Digital
† This test fails if a device is connected to the front panel input connectors.
‡ This test fails if the Source output is not connected to the Tachometer input.
Adjustment
Filter flatness, page 5-17
Input dc offset, page 5-10
ADC gain, offset, and
reference, page 5-7
Filter flatness, page 5-17
Next Step
Troubleshooting the Analyzer
To perform self tests
Troubleshooting Test
Tachometer, page 4-24
Performance test, page 4-42
4-35