Agilent Technologies 35670A Service Manual page 401

Agilent 35670A
Self Test
SELF TEST
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FUNCTIONL TESTS
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DIGITAL PROCESSOR
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TRIGGER
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LO
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DIGITAL FILTER
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FIFO
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BASEBAND
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ZOOM
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DGTL SRCE THRU DSP
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ALL
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SOURCE
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SOURCE LO
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SOURCE TO CPU
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WITHOUT LO
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WITH LO
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ALL
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INPUTS
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OFFSET
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DISTORTN
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INPUT TRIGGER
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INPUT A-WEIGHT
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AAF BYPASS
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INPUT ICP
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ALL
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TACHOMETR
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ADC GATE ARRAY
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OTHER
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INTERRUPT
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MULT FCTN PERIPHERL
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ALL
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ALL
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LOOP MODE ON/OFF
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TEST LOG
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CLEAR TEST LOG
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NEXT PAGE
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PREVIOUS PAGE
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GPIB Command
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TEST:DSP:TRIG; *WAI
TEST:DSP:LO; *WAI
TEST:DSP:FILT; *WAI
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TEST:DSP:FIFO; *WAI
TEST:DSP:BAS; *WAI
TEST:DSP:ZOOM; *WAI
TEST:DSP:SOUR; *WAI
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TEST:DSP:ALL; *WAI
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TEST:SOUR:LO; *WAI
TEST:SOUR:CPU; *WAI
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TEST:SOUR:BAS; *WAI
TEST:SOUR:ZOOM; *WAI
TEST:SOUR:ALL; *WAI
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TEST:INP:OFFS; *WAI
TEST:INP:DIST; *WAI
TEST:INP:TRIG; *WAI
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TEST:INP:AWE; *WAI
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TEST:INP:AAF; *WAI
TEST:INP:ICP; *WAI
TEST:INP:ALL; *WAI
TEST:TACH; *WAI
TEST:ADC:GARR; *WAI
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TEST:PROC:INT; *WAI
TEST:PROC:MFP; *WAI
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TEST:PROC:ALL; *WAI
TEST:ALL; *WAI
TEST:LOOP:MODE ON|OFF
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DISP:CONT TTAB
TEST:LOG:CLE
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Internal Test Descriptions
Self-Test Descriptions
10-19