Agilent Technologies 35670A Service Manual page 394

Internal Test Descriptions
Self-Test Descriptions
Self Tests that Perform a Measurement
The following self tests perform measurements:
Self Test
Baseband
Zoom
Source thru DSP
ADC gate array
Source to CPU
Source with LO
Source Without LO
Input Offset
Input Distortion
Input Trigger
Input A-Wt Filter
Input AAF/Bypass
Input ICP Source
The measurements that these self tests perform are averaged measurements, with only
one trace per average. Some hardware setup modes used in these self tests are not
used by normal measurements and can not be accessed from the front panel.
The measurements bypass any standard corrections and do not perform calibration
data corrections. Therefore, all self-test measurements using analog data have limits
larger than the standard calibration tolerances.
Once the hardware is set up, data is taken and time records are processed according to
the needs of the specific test. Some tests monitor overloads, others require spectrum
data, and others require time record data. After the data is collected, it is compared to
an internal reference specification to determine if the self test passed or failed. The
pass or fail information along with any additional information is placed in the Test
Log.
10-12
Front Panel Softkey
[ BASEBAND ]
[ ZOOM ]
[ DGTL SRCE THRU DSP ]
[ ADC GATE ARRAY ]
[ SOURCE TO CPU ]
[ WITH LO ]
[ WITHOUT LO ]
[ OFFSET ]
[ DISTORTN ]
[ INPUT TRIGGER ]
[ INPUT A-WEIGHT ]
[ AAF BYPASS ]
[ INPUT ICP ]
Agilent 35670A