Agilent Technologies 35670A Service Manual page 209

Failing Self Test
Interrupt
Mult Fctn Peripheral
Front Panel
GPIB
Disk Controller
Disk FIFO
IIC Bus (If only one
assembly is failing)
IIC Bus (If multiple
assemblies are failing)
Fast Bus
Trigger Gate Array
LO Gate Array
Digital Filter Gate Array
FIFO
Baseband Zoom
ADC Gate Array
All other self tests pass
Baseband
Zoom
All other self tests pass
Baseband
Zoom
Source through DSP
Source LO
Source to CPU
Agilent 35670A
Self-Test Troubleshooting Guide
Probable Faulty Assembly
A7 CPU
A7 CPU
A11 Keyboard Controller
A10 Rear Panel
A7 CPU
A7 CPU
Assembly failing. See Test
Log
See Test Log
A7 CPU
A6 Digital
A6 Digital †
A6 Digital
A6 Digital
A6 Digital
A5 Analog
A6 Digital
A5 Analog
A6 Digital
A5 Analog
A6 Digital
A6 Digital
A6 Digital
A6 Digital
† Analyers with firmware revision A.00.00 may fail the Trigger Gate Array test when the A1/A2 Input or
A5 Analog assemblies fail. Go to page 4-45, ''To troubleshoot source and calibrator failures,'' to
determine the probable faulty assembly.
Adjustment
Troubleshooting the Analyzer
To perform self tests
Troubleshooting Test
CPU, Memory, and Buses,
page 4-18.
IIC bus, page 4-25
Fast bus, page 4-29
Source and calibrator,
page 4-45
Source and calibrator,
page 4-45
4-33