Agilent Technologies 35670A Service Manual page 393

Functional Tests All Self-Test Group
Softkey
[ ]
INTERRUPT
[ ]
†
MULTI FCTN PERIPHERL
[ ]
†
FRONT PANEL
[ ]
GPIB FUNC TEST
[ ]
DISK CONTROLLR
[ ]
DISK FIFO
[ ]
IIC BUS
[ ]
FAST BUS †
[ ]
TRIGGER
[ ]
LO
[ ]
DIGITAL FILTER
[ ]
FIFO
[ ]
BASEBAND
[ ]
ZOOM
[ ]
DGTL SRCE THRU DSP
[ ]
SOURCE LO
[ ]
SOURCE TO CPU
[ ]
WITHOUT LO
[ ]
WITH LO
[ ]
ADC GATE ARRAY
[ ]
OFFSET
[ ]
DISTORTN
[ ]
INPUT TRIGGER
[ ]
INPUT A-WEIGHT
[ ]
AAF BYPASS
[ ]
INPUT ICP
[ ]
TACHOMETR $!
C5,5,0,255,255,255
[ ]
QUICK CONF TEST
X This assembly or sub-block is the most likely cause of the failure message.
failure message. No symbol means that the assembly is not used by the self test.
Agilent 35670A
Self Test Name
Interrupt
Multi Fctn Peripheral
Front Panel
GPIB
Disk Controller
Disk FIFO
IIC Bus
Fast Bus
Trigger Gate Array
LO Gate Array
Digital Filter Gate Array
FIFO
Baseband
Zoom
Source through DSP
Source LO
Source to CPU
Source without LO
Source with LO
ADC Gate Array
Input Offset
Input Distortion
Input Trigger
Input A-Wt Filter
Input AAF/Bypass
Input ICP Source
Tachometer
Quick Confidence
† High-level power-on tests
The power supply and display are used in every test.
A12/
A7 A8 A6
A22
X 0
X 0
X 0
X 0
X 0
X 0
X 0 X
X 0 X
0 0 X
0 0 X
0 0 X
0 0 X
0 0 X
0 0 X
0 0 X
0 0 X
0 0 X
0 0 X
0 0 X
0 0 0
0 0 0
0 0 0
0 0 0
0 0 0
0 0 0
0 0 0
0 0 X 0
0 0 0
0 This assembly or sub-block is used by the self test but is not the most likely cause of the
Internal Test Descriptions
Assembly
A1 A2 A5 A10
X X X X
X X X
X X X
X X X
X X X
X
X X X
X X X
X X X
X X X
X X X
X X X
X
X X X
Self-Test Descriptions
A11 A100
X
X
10-11