Self-Tests Description - Agilent Technologies 1670G Series User Manual

Logic Analyzer Concepts
The Analyzer Hardware

Self-tests description

The self-tests identify the correct operation of major functional areas in
the logic analyzer. The self-tests are not intended for component-level
diagnostics.
Three types of tests are performed on the 1670G-series logic analyzers:
the power-up self-tests, the functional performance verification self-
tests, and the parametric performance verification tests.
The power-up self-tests are performed when power is applied to the
instrument. The power-up self-tests are divided into two parts. The
first part is the system memory tests and the second part is the
microprocessor interrupt test. The system memory tests are performed
before the logic analyzer actually displays the power-up self-test
screen. Both the system ROM and RAM are tested during power-up.
The interrupt test is performed after the power-up self-test screen is
displayed.
The functional performance verification self-tests are run using a
separate operating system, the performance verification (PV)
operating system. The PV operating system resides on a separate disk
that must be loaded when running the functional performance
verification self-tests. The system and analyzer tests are functional
performance verification tests.
Parametric performance verification requires the use of external test
equipment that generates and monitors test data for the logic analyzer
to read. Refer to the Agilent Technologies 1670G-Series Logic
Analyzers Service Guide for further information about parametric
performance verification.
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