On-Wafer Measurements - HP 8753E User Manual

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On-Wafer Measurements

Hewlett-Packard Company, "On-Wafer Measurements Using the HP 8510 Network Analyzer and

Cascade Microtech Wafer Probes," Product Note 8510-6 HP publication number 5054-1570

Barr, J.T., T. Burcham, A.C. Davidson, E. W. Strid, "Advancements in On-Wafer Probing

Calibration Techniques, n Hewlett-Packard RF and Microwave Measurement Symposium paper,

Lautzenhiser, S., A. Davidson, D. Jones, "Improve Accuracy of On-Wafer Tests Via LRM

Calibration," Reprinting from "Microwaves and RF" HP publication number 5052-1286, January

"On-Wafer Calibration: Practical Considerations, n HP 8510/8720 News HP publication number

Application and Operation Conoepts

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