Hitachi U-5100 Instruction Manual page 279

Table 5-2 Measuring Conditions and Judgment Standard
for Wavelength Accuracy (at 229.0 nm)
Item
Measuring
conditions
Calculation method
Judgment standard
Table 5-3 Measuring Conditions and Judgment Standard
for Wavelength Accuracy (at 822.8 nm)
Item
Measuring
conditions
Calculation method
Judgment standard
5 - 5
Wavelength Accuracy (at 229.0 nm)
Emission spectrum of Xe lamp bright line
(with detector on the monitor side)
Wavelength range :
Scan speed :
Data interval :
Response :
Spectrum to be measured
Determination of a difference between
peak wavelength of the measured
spectrum and 229.0 nm
Wavelength accuracy (at 229.0 nm) =
(obtained peak wavelength) - 229.0
Within ±2.0 nm
Wavelength Accuracy (at 822.8 nm)
Emission spectrum of Xe lamp bright line
(with detector on the monitor side)
Wavelength range :
Scan speed :
Data interval :
Response :
Spectrum to be measured
Determination of a difference between
peak wavelength of the measured
spectrum and 822.8 nm
Wavelength accuracy (at 822.8 nm) =
(obtained peak wavelength) - 822.8
Within ±2.0 nm
5.1.1
223.0 to 235.0 nm
40 nm/min
High resolution
Standard
816.8 to 828.8 nm
40 nm/min
High resolution
Standard