Figure 11-13 Completed Custom Dac; Dgs/Avg - Olympus EPOCH 650 User Manual

Ultrasonic flaw detector
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DMTA-10055-01EN, Rev. A, February 2015
Once the custom DAC curve points have been captured and completed, you have full
capability to toggle between DAC and TCG views, to manipulate Range, Delay, CAL
Zero, and Angle, and also to add necessary scanning gain, curve gain adjustment or
transfer correction. The TCG view of any custom DAC curve includes the user-
defined reference curves as well as the primary DAC curve. Custom DAC curve also
incorporates the reference correction functionality, if desired.

11.3 DGS/AVG

The Onboard DGS/AVG option in the EPOCH 650 ultrasonic flaw detector permits
complete DGS/AVG setups to be performed on the instrument. With the DGS/AVG
method, you can size defects based upon a calculated DGS/AVG curve for a given
transducer, material, and reflector size. This method requires that you only have one
reference-reflector in order to create a DGS curve for flaw sizing. This is much
different than the DAC or TCG method which requires that you have representative
defects at various depths within a part in order to create a curve for flaw sizing.
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Chapter 11

Figure 11-13 Completed custom DAC

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