Agilent Technologies 1100 Series Reference Manual page 80

3
Troubleshooting and Test Functions
The sample or reference diode's data is processed without filtering and logarithming.
Analog output test
This test adds to the used zero offset setting a DC voltages of 10 µV in cycles of 12
seconds. This 10 µV step is equal to 1 × 10
recording device. See
Sample or reference diode current
Shows the diodes current.
Sample or reference gain
This function shows the current the gain setting.
Lamp anode/heater voltages and currents
Provides the information of actual voltages and currents of the lamp's anode and
filament.
Grating or Filter Motor motor steps
Provides the step numbers of grating or filter motor settings.
Grating or Filter position sensor
Checks the movement of grating or filter.
Board Temperature
An on-board temperature sensor on the VWM board provides the actual temperature on
the board. This information is running continuously into a buffer from which it can be
retrieved as last-12-hours plot.
Leak Status
Provides status of PTC and NTC sensors. See
78 1100 Series Variable Wavelength Detector Reference Manual
-6
"DAC Test"
on page 71.
AU and can be used to check the noise on a
Table 8 on page 79.