Data Storage - YOKOGAWA DL850E User Manual

Analysis
Item
Zooming and searching
History search feature
Cursor measurement
Automated measurement
of waveform parameters
Statistical processing
Normal statistical
processing
Cyclic statistical
processing
Statistical processing of
the history data
Computation
User-defined computation
(/G2 option)
Phase shifting
GO/NO-GO determination
Screen Capture Data Output
Item
Built-in printer
(/B5 option)
External printer
File format

Data Storage

Item
History
Internal HDD and external
storage media
IM DL850E-03EN
Specifications
You can search for and then expand and display a portion of the displayed waveform.
You can choose from the following search methods.
Edge: The DL850E/DL850EV counts the number of rising or falling edges
Logic pattern: The DL850E/DL850EV counts the number of times a logic pattern is
detected.
Event: The DL850E/DL850EV searches for an event number.
Time: The DL850E/DL850EV searches for a date and time.
You can search through history waveforms for specified conditions.
Zone search: The DL850E/DL850EV displays waveforms that pass through or do not pass
through a specified area on the screen.
Parameter search: The DL850E/DL850EV displays a waveform when the results of the
automated measurement of its parameters meet the specified conditions.
Horizontal, Vertical, H&V, Degree (only during T-Y waveform display) and Marker
Automated measurement of waveform parameters
Up to 32 items can be displayed.
P-P, Amp, Max, Min, High, Low, Avg, Mid, Rms, SDev, +OverShoot, −OverShoot, Rise, Fall, Freq,
Period, +Width, −Width, Duty, Pulse, Burst1, Burst2, AvgFreq, AvgPeriod, Int1TY, Int2TY, Int1XY,
Int2XY, Delay(between channels)
Applicable items:
Statistical items:
Maximum number of cycles:
Maximum total number of parameters: 64000
Statistical processing is performed while waveforms are acquired.
The DL850E/DL850EV automatically measures the waveform parameters of the data in the
acquisition memory and performs statistical processing on the parameters once per period.
The DL850E/DL850EV automatically measures the waveform parameters of each history waveform
and performs statistical processing on the parameters.
Operators: +, −, ×, ÷, binary computation, phase shift, and power spectrum
Expressions can be created through the combination of the following operators and constants.
ABS, SQRT, LOG, EXP, NEG, SIN, COS, TAN, ATAN, PH, DIF, DDIF, INTG, IINTG, BIN, P2, P3,
F1, F2, FV, PWHH, PWHL, PWLH, PWLL, PWXX, DUTYH, DUTYL, FILT1, FILT2, HLBT, MEAN,
LS-, RS-, PS-, PSD-, CS-, TF-, CH-, MAG, LOGMAG, PHASE, REAL, IMAG
You can monitor the waveform of a specified channel with its phase shifted
The following two types of GO/NO-GO determination are available:
• Determination using zones on the screen
• Determination using the automated measurement values of waveform parameters.
The following operations can be performed at the time of determination:
Output of screen capture data, saving of waveform data (to binary, ASCII, floating-point, or
MATLAB), sounding of a notification buzzer, transfer of e-mail
Specifications
A hard copy of the screen can be output.
Prints screen captures on an external printer connected over an Ethernet or USB.
PNG, JPEG, or BMP
Specifications
Automatically holds up to 5000 pages of waveforms (depending on the record length)
Waveform data, setup data, automated measurement values, and the results of statistical
processing can be saved.
Automated measurement values of waveform parameters
Max, Min, Avg, Sdv, and Cnt
64000 cycles (when the number of parameters is 1)
6.5 Features
1
2
3
4
5
6
App
Index
6-5