Figure 9-6: Power Interrupt - California Instruments MX30-1 User Manual

Mx series ac and dc power source series i / series ii
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User Manual - Rev AJ
POWER
INTERRUPT
This test r
equires a numeric entry value equal to the test number. The tests are grouped as follows:
• Test numbers 1 through 15 are for all Standard and Groups. See Figure 9-6 for details of the tests.
• Test numbers 16 a
nd 17 for all equipment that does not incorporate digital circuit. Test number 16 will
drop the output to zero voltage for 50 ms. Test number 17 will drop the output to zero voltage for 200
ms
. Test number 18 is used for DC equipment and will drop the output for 1 sec.
• Test numbers 21 through 26 are applicable for Groups 2 and 3 only. Output frequency will be set to the
F1 value for 1 second prior to the test. The output frequency will remain set to the F2 value when the
test is completed. This will allow the user to apply sequence of power interrupts. See Figure 9-7 for
detail of the tests.
DO160 Table 16-1: Test conditions for equipment with digital circuits.
NOTES
1:
Definitions:
T1
T2
T3
V MIN
2:
Tolerance to T1, T2, T3 = ± 10%
3:
Test condition numbers 8 and 15 are for category Z, dc powered equipment only.
Applica
ble
Catego
ry:
Test
1**
2
Conditi
on
No.
T1 (ms)
2**
10
T2 (ms
)
<1
20*
T3 (ms
)
<1
5
%V No
m.
0
50
(V min)
*
Voltage will not reach zero i this test con
**
Equipment performance standards may require to repeat test n°1 w th T1 varying from 5 to 200 ms by step
defined in the test equipment
on equipment design.
MX Series
V (NOM)
% of V NOMINAL
(V MIN)
0 VOLTS
Power interrupt time
Time it would take for the applied voltage to decay from V (nom) to zero volts.
Time it would take for the applied voltage to rise from zero to V (nom) volts.
The minimum leve
l (express d as a percentag
voltage is permitted to decay.
A
A, Z
3
4
5
6
25
50
75
100
20
20
20
20
5
5
5
5
15
10
5
0
n
dition.
perform
ance stand
ards (s

Figure 9-6: Power Interrupt

T1
T2
T3
e
e of V NOMINAL) to which the applied
Z
A, B, Z
7
8
9
200
1000
10
20
20
50*
5
5
20
0
0
80
i
tep typicall
y comp
rised between 5 ms and 20 ms depending
California Instruments
A, Z
10
11
12
13
25
50
75
100
50*
50
50
50
20
20
20
20
50
0
15
5
Z
14
15
200
1000
50
50
20
20
0
0
197

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