If Measured Value Oscillates when Measuring
High-Frequency Devices
When measuring parameters of high-frequency devices, such as GaAs MESFETs or
high-frequency bipolar transistors, oscillation may cause measurement problems.
Normal measurement cannot be performed because of oscillation.
To solve this problem:
•
For FETs, add resistive ferrite beads as close as possible to the gate.
•
For bipolar transistors, add resistive ferrite beads as close as possible to the base
or emitter.
•
Make connection cables as short as possible. Long wires cause oscillation
because of their large inductance.
To module
Ferrite beads
Keysight E5260/E5270 User's Guide, Edition 6
If You Have a Problem
When You Make a Measurement
Test device
To module
7-5