If Measured Value Oscillates When Measuring High-Frequency Devices - Keysight Technologies E5260 Series User Manual

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If Measured Value Oscillates when Measuring
High-Frequency Devices
When measuring parameters of high-frequency devices, such as GaAs MESFETs or
high-frequency bipolar transistors, oscillation may cause measurement problems.
Normal measurement cannot be performed because of oscillation.
To solve this problem:
For FETs, add resistive ferrite beads as close as possible to the gate.
For bipolar transistors, add resistive ferrite beads as close as possible to the base
or emitter.
Make connection cables as short as possible. Long wires cause oscillation
because of their large inductance.
To module
Ferrite beads
Keysight E5260/E5270 User's Guide, Edition 6
If You Have a Problem
When You Make a Measurement
Test device
To module
7-5

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