Hitachi TM3030 Plus Instruction Manual page 142

1b. Standard
This observation mode is suitable for observing either conductive or non-conductive
samples. Select this mode especially when observing non-conductive samples (e.g.
plastic, paper, fiber, rubber, ceramic, biological samples, foods, etc).
When [Standard] is selected, the [M] mark is displayed in the information area located
in the lower right part of the image observation area. (see 4.3.2)
Figure 4.2.5-3 Signal Select / Observation Mode Settings (BSE – Standard)
1c. Chg-up Red.
When observing non-conductive samples in the [Standard] mode, brightness /
contrast can change over time (i.e. brightness change) or image can look shifted
unexpectedly (i.e. image deviation). In such cases, set the observation mode to
[Chg-up Red.].
When [Chg-up Red.] is selected, the [L] mark is displayed in the information area
located in the lower right part of the image observation area. (see 4.3.2)
Figure 4.2.5-4 Signal Select / Observation Mode Settings (BSE – Chg-up Red.)
2. SE (Secondary Electron)
Topographical information on a sample surface can be obtained. Every time the [SE]
button is clicked, [Standard] or [Chg-up Red.] is selected in order. The current mode will
be displayed under the [SE] button. Select a desired mode, depending on the specimen
to be observed and the observation purpose.
When [SE] is selected, the [U] mark is displayed in the information area located in the
lower right part of the image observation area. (see 4.3.2)
2a. Standard
This observation mode is suitable for observing either conductive or non-conductive
samples.
When [Standard] is selected, the [M] mark is displayed in the information area located
in the lower right part of the image observation area. (see 4.3.2)
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