Hitachi TM3030 Plus Instruction Manual page 139

1c. High mag.
An electron beam is more focused than [Middle mag.], achieving high resolution.
Although charge-up phenomenon and damage to samples can be minimized,
contrast or image degradation can occur depending on the observed sample or
magnification. This condition is suitable for observation at a magnification of 6,000x to
30,000x. This magnification is only reference value. Set the advanced value
depending on samples and purpose.
When [High mag.] is selected, the [h] mark is displayed in the information area
located in the lower right part of the image observation area. (see 4.3.2)
Figure 4.2.4-4 Observation Condition Settings (5 kV - High Mag.)
The features of the observation condition of [5kV] are explained below.
Electron beam focusing
Image contrast
Image quality
Charge-up phenomenon
Sample damage
Figure 4.2.4-5 Features of the observation condition [5kV]
Low Mag. Middle Mag.
Coarse
High
Fine
High
High
4 - 20
High Mag.
Fine
Low
Coarse
Low
Low