Test - Compaq ES40CSLP Installation, User & Service Manual

Rackmount system
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Troubleshooting and Diagnostics
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P00>>>init
OpenVMS PALcode V1.44-1, Tru64 UNIX PALcode V1.41-1
...
starting console on CPU 0

6.6.2.19 test

The test command verifies all the devices in the system. This command can be used on all
supported operating systems: Tru64 UNIX and OpenVMS.
The tests are run sequentially for a minimum of 10 seconds per test. The status of each
subsystem test is displayed to the console terminal as the test progresses. If a particular device
is not available to test, a message is displayed. The test script does no destructive testing, that
is, it does not write to disk drives.
To run a complete diagnostic test using the test command, the system configuration must
include:
A serial loopback connected to the COM2 port
A parallel loopback connected to the parallel port
A trial diskette with files installed
A trial CD-ROM with files installed
The test script tests devices in the following order:
1. Memory tests (one pass).
2. Read-only tests: DK* disks, DR* disks, DQ* disks, DU* disks, MK* tapes, DV* floppy.
3. Console loopback tests if -lb argument is specified: COM2 serial port and parallel port.
4. VGA console tests. These tests are run only if the console environment variable is set to
serial. The VGA console test displays rows of the word "compaq."
5. Network internal loopback tests for EW* networks.
______________________________ Note ___________________________
By default, no write tests are performed on disk and tape drives. Media must be
installed to test the floppy drive and tape drives.
______________________________________________________________
Syntax
test [-lb]
Argument:
[-lb]
6–46 Compaq ES40CSLP Rackmount System Installation/User/Service Guide
exer_kid dka0.0.0.2.1
exer_kid dka100.1.0.2
exer_kid dka200.2.0.2
exer_kid dqa0.0.0.15.
exer_kid dfa0.0.0.2.1
exer_kid dfb0.0.0.102 1066
exer_kid dva0.0.0.100
nettest ewa0.0.0.4.1
The loopback (-lb) option runs console loopback tests for the COM2 serial port
and the parallel port during the test sequence.
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