Executional Conditioned Device Test - Mitsubishi Electric melsec q00ujcpu User Manual

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6.11.4 Executional conditioned device
This function changes a device value within the specified step of a sequence program.
This enables debugging of the specified ladder block without modifying the sequence program.
*1: The executional conditioned device test is targeted for sequence programs only. (SFC programs are not supported.)
(1) Operation of the executional conditioned device test
A device value will be changed based on the registration data once after the executional conditioned device test
setting is registered.
The changed device value becomes effective in the ladder blocks of the specified step number and later.
Registration data
Program name
Step No.
Device
Setting value
: Before executing instruction
Execution timing
GX Developer
Note that a device value is changed within the specified step regardless of an execution status of the instruction in
the specified step.
<Program example>
Ladder mode
Executional conditioned device test which
sets "35" in D0 in this step is registered.
Figure 6.40 Operation example of the executional conditioned device test
注 1
Note6.4
Universal
When using the executional conditioned device test in the Q02UCPU, Q03UDCPU, Q04UDHCPU, Q06UDHCPU,
Q13UDHCPU, or Q26UDHCPU, check the versions of the CPU module and GX Developer.(
Program: MAIN
: MAIN
: 10
: M0
: ON
Figure 6.39 Operation of the executional conditioned device test
List mode
testíç1
Note6.4
M0 is turned on.
<Operation>
Processing
LD M0
Value in D0
10
Value in M0
A device value is changed within the
specified step regardless of the value in M0.
CHAPTER6 FUNCTIONS
*1
+ K10 D0
Changes the value in D0 to "35".
35
45
OFF
Appendix 2)
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