Executional Conditioned Device Test - Mitsubishi Electric L02SCPU User's Manual And Reference

3.19

Executional Conditioned Device Test

This function changes a device value for the specified step of a program. This enables debugging of the specified
ladder block without modifying the program.
The executional conditioned device test is not available for the SFC program.
(1) Operation of the executional conditioned device test
A device value is changed based on the registration data once the executional conditioned device test setting is
registered.
Program
Step number
Device
Setting value
Execution timing
Note that a device value is changed in the specified step regardless of an execution status of the instruction in
the specified step.
[Program example]
Register executional conditioned device
test that sets "35" to D0 in this step.
(2) Applicable devices
The following table shows the applicable devices and the number of settable devices.
Type
Bit device X (DX), Y (DY), M, L, B, F, SB, V, SM, T (contact), ST (contact), C (contact), FX, and FY
T (current value), ST (current value), C (current value), D, D (extended data register), SD, W, W
(extended link register), SW, R, ZR, Z, U\G, FD
Word device
Digit-specified bit device: X, Y, M, L, F, SM, V, B, SB
Indirect specification (@D0): D, SD, W, SW, R, ZR (devices specified with @)
Program : MAIN
Registration
data
: MAIN
: 10
: M0
: ON
: Before instruction execution
Programming tool
Applicable device
CHAPTER 3 CPU MODULE FUNCTIONS
879
Turns on.
[Operation]
Changes the D0 value to "35".
Processing
LD M0
D0 value
10
M0 value
A device value is changed at the specified
step regardless of the M0 value.
879
879
879
880
880 880
+ K10 D0
35 45
OFF
Number of settable
devices
Up to 32 (in total)
135
3