Table of Contents
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Revision history
Table A-2. Changes between revisions 1 and 2 (continued)
Chapter
Chapter 32
Power Management Controller
(PMC)
(cont.)
Chapter 33
JTAG Controller
Chapter 35
Temperature Sensor
1710
• In functional description bandgap reference of 2.7V deleted.
• In bandgap section, description of 1.219V reference voltage "...that varies by
±4% before calibration and ±1% after calibration over temperature and
lifetime" deleted.
• In 5V LVI section, following statement deleted: "Maximum hysteresis value
between rising and falling trip points is 90 mV"
• In 5V LVI section, "In case the monitored voltage falls below the *nominal* trip
point, the LVI output goes to logical 0" changed to, "In case the monitored
voltage falls below the *falling* trip point, the LVI output goes to logical 0".
• In LVI section, description of resistor chain deleted.
• Nominal 4.29V trip value noted as being typical and subject to variance.
• In 3.3V internal voltage regulator section, following text deleted: "Tolerance of
the 3.3 V supply is -5% / +10% including line and load variation. Detail on
disabling voltage regulator added.
• In 3.3V LVI section, noted that there are 2 LV monitors. Also deleted
hysteresis spec.
• In 3.3V LVI section noted 3.09V (was 3.00V) trip value as being typical and
subject to variance.
• In 1.2V regulator section, "tolerance of ±10%" on 1.2V supply current deleted.
• In 1.2V regulator section, default voltage is 1.28 V (was 1.270V).
• 1.2V LVI section: hysteresis spec deleted. Rising trip point is 1.16 (was 1.08).
• Power On Reset section: typical values table deleted.
• Sections added describing modules affected by PMC.
• ADC test mux section added
• Electrical characteristics removed. See data sheet.
• Replaced PMC block diagram
• Replaced bandgap reference block diagram
• Replaced Vreg 3.3 V power connection diagram
• VDDEH referring to supply of closest I/O segment changed to VDDEH1.
Device-specific info section added
New chapter
MPC5644A Microcontroller Reference Manual, Rev. 6
Changes
Freescale Semiconductor
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