HP 1660E Series Service Manual page 32

Testing Performance
To
perform the self-tests
166(:1CP PERFORMANCE VEPH'ICATJDrI
(NOTE'
Output~
ore llctive during
\e~\in~)
Clock Sourt€ Test
Sllltus WnESTm
Vector tlemory Test
Status UNTESTED
Address Counter Test
Sliltus UIiTESTEE,
Instruction Tetts
SliltU$ UNTESTECo
( All Tech
l
12 Record the results of the tests on the performance test record at the end of this
chapter, then continue with step 15.
13 For the lIP 1660ES-series logic analyzers, Select Analy PV, then select Scope PV in
the pop-up menu. In the Scope PV menu, select Functional Tests then select All
Tests.
You can run all tests at one time, except for the Data Input Inspection, by
rurming
All Tests.
To see more details about each test when troubleshooting failures, you can run each test
individually. This example shows how to run all tests at once.
When the tests finish, the status for each test shows Passed or Failed.
Funcllonol Tests
Dolo Memory Te-:.t
Stotus PASSED
TlmebaSe Test
5
(fl
tllS PASSED
1'1/('
Test
StMu5 PASSED
[>/1'1
Test
$Io\tis PASSED
Tngger Te~l
StHu$ PASSEro
Ins Test
StHltS PASSED
PLEASE DISCONNECT ALL INPUTS ( All Tests
1
-
14 Record the results of the tests on the performance test record at the end of this
chapter.
15 To exit the test system, press the System key, then press the Select key. Select Exit
Test, then select Exit Test System.
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