HP 1660E Series Service Manual page 31

Testing Performance
To perform the self-tests
POM les
l
~16tu:;
PASSED
RAM Test
tl~l,,~ PASSECO
HP-I6 Test
:;\61"$ PASSEro
RS-2:52C Test
stotus PASSm
PS2 Test
St6\11~
PASSEr,
[lISI Test
status
PASSED
Lon Test
stotus
PASSEll
F~ont Panel Test
stotus TESTED
DIsplay Test
.totU$ TESTED
All SysternT,;sts
<;talUS TESTED
9 Select Sys PV, then select Analy PV in the pop-up menu. In the Analy PV menu,
Select All Analyzer Tests.
You can nm all tests at one time, except for the Data Input Inspection, by nmning All
Analyzer Tests. To see more details about each test when troubleshooting failures, you can
nm each test individually. This example shows how to nm all tests at once.
When the tests fInish, the status for each test shows Passed or Failed, and the status for the
All Analyzer Tests changes from Untested to Tested.
tlllP
:2
Tests
:;tOlllS PASSED
Chip:;' Tests
':ilotus PASSEl)
Chip
-l
Tests
status
PASSED
Chip 5 rliSl$
status PASSED
Boord Tests
stllt\lS PASSED
AI \ An61y:er Tests
status
TESTEr>
10 Record the results of the tests on the performance test record at the end of this
chapter.
11 For the HP 1660EP-series logic analyzers, Select Analy PV, then select Patt Gen in
the pop-up menu. In the Patt Gen menu select All Tests.
You can nm all tests at one time (except the Output Patterns routine) by selecting All Tests.
To see more details about each test, you can run each test individually. This example shows
how to run all tests at once.
When the tests finish, the status for each test shows Passed or Failed.
3-5