Testing Performance - HP 1660E Series Service Manual

3
To perform the self-tests 3-3
To make the test connectors (logic analyzer) 3-7
To test the threshold accuracy (logic analyzer) 3-9
To test the glitch capture (logic analyzer) 3-18
To test the single-clock, single-edge, state acquisition (logic analyzer) 3-24
To test the multiple-clock, multiple-edge, state acquisition (logic analyzer) 3-37
To test the single-clock, multiple-edge, state acquisition (logic analyzer) 3-49
To test the time interval accuracy (logic analyzer) 3-60
To test the CAL OUTPUT ports (oscilloscope) 3-65
To test the input resistance (oscilloscope) 3-69
Perform an operational accuracy calibration 3-72
To test the voltage measurement accuracy (oscilloscope) 3-73
To test the offset accuracy (oscilloscope) 3-77
To test the bandwidth (oscilloscope) 3-82
To test the time measurement accuracy (oscilloscope) 3-87
To test the trigger sensitivity (oscilloscope) 3-91
Performance Test Record (logic analyzer) 3-95
Performance Test Record (oscilloscope) 3-101
Performance Test Record (pattern generator) 3-104
Testing Performance