Agilent Technologies N4413A User Manual page 91

Multiport test system
Table of Contents

Advertisement

Performing Time Domain Measurements
General Theory
An alternative method of obtaining time-domain characterization of a device is to make the
measurement directly in the time domain by synthesizing a step waveform, applying it to the
device, and observing the response on an oscilloscope. The advantages of using the
measurement approach for TDR data are listed below.
While the traditional TDR measurement technique provides fast measurement speed, the
measurement technique used by the multiport test system provides:
• Superior accuracy
• Significantly better dynamic range (important for crosstalk and mode-conversion terms)
• Ability to de-embed fixtures and signal launchers
• Access to both frequency and time domain information (as vector quantities)
• Single setup for forward and reverse transmission and reflection, single-ended,
differential-, and common-mode, and mode-conversion terms
• No need for DUT to have DC return path
• No large voltage steps applied to DUT
Chapter 4
81

Advertisement

Table of Contents
loading

This manual is also suitable for:

N4414aN4415aN4416aN4417aN4418aN4419a ... Show all

Table of Contents