Agilent Technologies Agilent 33500 Series Operating And Service Manual page 419

Self-Test Procedures
Error
613 Self-test failed; Chan n, waveform memory not initialized
Waveform RAM for indicated channel (U1101 or U1102) failed to initialize.
615 Self-test failed; modulation ADC offset too low (too high)
Internal ADC's measurement of ACOM out of limits.
616 Self-test failed; modulation ADC reference too low (too high)
Internal ADC's measurement of its voltage reference (VRef) was out of limits.
620 Self-test failed; Chan n, waveform memory test failed on idle
Waveform memory test not started properly, probably due to error in waveform
FPGA (U1005)
621 Self-test failed; Chan n, waveform memory test failed
Waveform RAM memory test for the indicated channel (U1101 or U1102) failed;
test consists of writing and reading back the entire waveform RAM with a prede-
termined pattern.
625 Self-test failed; Chan n, waveform DAC gain[idx] too low (too high)
Waveform DAC (U1801 or U1501) not providing correct output. Gain [idx] of 1
references POS voltage test; gain [idx] of 2 references NEG voltage test.
630 Self-test failed; Chan n, sub attenuator failure 0dB
Trim DAC inside waveform DAC (U1801 or U1501) not providing correct output
at 0 dB. If this fails, test 631 will not be executed.
631 Self-test failed; Chan n, sub attenuator <-7.00 to 0.00>dB too low
(too high)
Trim DAC inside waveform DAC (U1801 or U1501) producing output outside
expected range.
635 Self-test failed; Chan n, null DAC gain[idx] too low (too high)
Aux DAC output of waveform DAC (U1801 or U1501) or its associated analog cir-
cuitry producing output outside expected range. Gain [idx] of 1 references POS
voltage test; gain [idx] of 2 references NEG voltage test.
640 Self-test failed; Chan n, offset DAC gain[idx] too low (too high)
Offset DAC (U1702 or U2002) or its associated circuitry producing output out-
side expected range. For offset DAC, [idx] polarities are inverted: gain [idx] of 1
references NEG voltage test; gain [idx] of 2 references POS voltage test.
418
Message and Meaning
Agilent 33500 Series Operating and Service Guide
Probable Cause
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