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14.2.24 Test operation
Before performing the quick test operations of the system monitor function (such as turning ON or OFF bit
device, changing the word device current value, changing the settings or current values of the timer or
counter, and changing the buffer memory current value), read through the manual carefully and make
yourself familiar with the operation method.
During test operation, never change the data of the devices which are used to perform significant
operation for the system.
False output or malfunction can cause an accident.
You can specify and test any station and device that can be monitored during monitoring by the system
monitor function. This section describes how to test the bit or word devices of the controller or the buffer
memory of the intelligent function unit.
14.2.25 Procedure for displaying the test menu screen and the setting key
window screen
This subsection describes how to display the test menu screen and the setting key window screen.
Touch
TEST
Test menu screen
Touch any switch.
Setting key window screen
WARNING
Touch
1
(When performing test operation from the Entry Monitor
2
SET
Touch
screen)
Touch
2
The test menu screen appears.
3
Touch
3
BM VAL 32
Operation example: touch
For a detailed description of each key function, see the following:
4
menu screen and key functions
The setting key window screen appears.
4
Display example: set value operation screen of T (timer) and
C (counter)
For further information about each setting key window, see
5
the following:
6
displayed on each setting key window screen
For further information about the test operation procedure,
7
see the following:
8
.
SET
TEST
.
,
,
SET/RST
SET VAL
VALUE 16
SET VAL
Subsection 14.2.26 Information displayed on the test
Subsection 14.2.27 Information and set items
Subsection 14.2.28 Test operation procedure
14.2 System Monitor
14.2.24 Test operation
,
,
or
VALUE 32
BM VAL 16
14 - 41
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10
11
12
13
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16
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Troubleshooting
