C.2.7
Diagnostic Tests
These tests verify the integrity of the detector electronics and functions.
DAC RAMP:
P
POWER
Help Message
Screen Field
CELL
NOISE TEST
DAC RAMP
Doc. 065551-01 6/13
DIAGNOSTIC TESTS
CELL: INT
NOISE TEST:
RDY
SCOPE TEST: RDY
P
CPU
P AES/SRS
P
LAN
>
Figure C-25. Diagnostic Tests Screen
Description
Specifies whether the cell to be tested is internal (INT) or external
(EXT).
Selects a cell for noise testing. The test modes are:
—
RDY
The system is idle and ready to begin a test.
—
CD
Selects a conductivity cell for testing.
—
EC
Selects an amperometry cell for testing.
Selects the DAC test mode. The test linear ramps the output of the
selected DA on the SP or SCR card from 0 to full-scale and can be
plotted from either the recorder output or the chromatography
software. The ramp test modes are:
—
RDY
The system is idle and ready to begin a test.
—
CDO
Tests the CD Offset DAC (eight iterations, one for each
gain; the eighth iteration is flat on top). Disconnect the conductivity
cell before running this test.
—
REC
Tests the Recorder Output DAC.
—
ECO
Tests the EC Offset DAC (two iterations; one for the ADC
fine channel and one for the ADC coarse channel). Disconnect the
amperometry cell before running this test.
C • User Interface
RDY
CELL DRIVE
*
*
LEAK
DS3
C-27