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Dionex ED50A Electrochemical Detector
Screen Field
SCOPE TEST
C-28
Description
—
ECD
Tests the EC Drive DAC. A full-scale ramp is repeated over
and over until you exit the test or the screen. Disconnect the
amperometry cell before running this test.
Generates test waveforms that can be monitored on test points on
the SCR and SP cards, using an oscilloscope or chart recorder. The
test modes are:
—
RDY
The system is idle and ready to begin a test.
—
CDF
Tests the CD Offset DAC output (TP9 on the SP card) and
the CD fine filter circuit (TP19 on the SP card). TP9 outputs a
square wave with a frequency of 200 ms and an amplitude from 0 to
-0.1 V. TP19 outputs a sine wave with a frequency of 200 ms. The
peak-to-peak amplitude is 4.40 V.
—
CDT
Tests the CD Temperature Compensation DAC (TP26 on
the SP card). The output is a square wave in which the bottom and
top amplitudes increase and decrease from 11 V to 12 V. Before
running this test, connect the Dionex DS3 and set the temperature to
45 C, or connect a dummy thermistor value of 42 to pins 2 and
3 of the conductivity cell connector.
—
SCR
Tests the SCR DAC for the Dionex DS3 set point
temperature (TP13 on the SCR card) and suppressor current set
point (TP17 on the SCR card). The output on each test point is a
linear ramp that goes from 0 to 10 V in 2.5 seconds. Disconnect the
Dionex DS3 and suppressor before running this test.
—
PHD
Tests the pH DAC (TP10 on the SP card). The output is a
waveform with an increasingly linear ramp that goes from
approximately 0 to 0.87 VDC in 31 seconds, with a steep slope for
the first 5.5 seconds of the ramp. The decreasing side of the ramp is
25.5 seconds in duration.
Doc. 065551-01 6/13
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