Basic Operations Of The Microscope (Reflected Light Brightfield/Darkfield Observations); Reflected Light Brightfield/Darkfield Observation Procedures - Olympus GX53 Instructions Manual

Inverted system metallurgical microscope
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3 3
Basic operations of the microscope
(Reflected light brightfield/darkfield observations)
This section describes the operating procedures of the reflected light brightfield/darkfield observations which are the
basis of observation methods. The polarization observation and the differential interference contrast observation, etc. are
described in "4 Various observation methods" on page 30.

3-1 Reflected light brightfield/darkfield observation procedures

1
2
3
Select the observation light path.
4
5
Engage the 10X objective in the light path.
6
Engage the objective with the magnification
10
to be used in the light path and
Adjust the aperture diaphragm and
11
(Fully open the aperture diaphragm during darkfield observation.)
14
Set the main switch to (ON).
Select the brightfield (BF) or
darkfield (DF) observation.
Remove the analyzer, polarizer or
filter sliders from the light path.
Place a sample on the stage.
Bring the sample into focus.
7
Adjust the brightness.
8
Adjust the interpupillary distance.
Adjust the diopter
9
bring the sample into focus.
the field diaphragm.
Insert the required filters.
12
13
Adjust the brightness.
Observation
Operation part
Main switch
BF/DF selection lever
Eyepiece/camera light path selection
knob
Light path selection knob on trinocular tube
or Observation/SP selection knob on the
side port
Stage plate
X-axis/Y-axis knobs
Revolving nosepiece
Coarse/Fine focusing knobs
Brightness control knob
Interpupillary distance adjustment scale
Diopter adjustment ring
Revolving nosepiece
Coarse/Fine focusing knobs
Aperture diaphragm lever
Field diaphragm lever
Filter slider insertion slot
Brightness control knob
Page
P.16
P.17
P.18
P.19
P.19
P.20
P.21
P.22
P.23
P.23
P.20
P.21
P.26
P.27
P.28
P.22

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