Agilent Technologies 16517A User Reference
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Agilent Technologies 16517A User Reference

4-gsa/s timing and 1-gsa/s synchronous state logic analyzer
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  • Page 1 (217) 352-9330 | Click HERE Find the Keysight / Agilent 16517A at our website:...
  • Page 2 User’s Reference Publication number 16517-97009 February 2000 For Safety information, Warranties, and Regulatory information, see the pages behind the Index © Copyright Agilent Technologies 1987-2000 All Rights Reserved Agilent Technologies 16517A/18A 4-GSa/s Timing and 1-GSa/s Synchronous State Logic Analyzer...
  • Page 3 The Agilent Technologies 16517A 4-GSa/S Timing and 1-GSa/S State Logic Analyzer...
  • Page 4 In This Book General Information Probing The Format Menu The User’s Reference contains field and feature definitions. Use this part of the manual set for information on what the The Trigger Menu menu fields do, what they are used for, and how the features work.

  • Page 6: Table Of Contents

    Contents 1 General Information User Interface 1–4 Configuration Capabilities 1–5 Accessories Supplied 1–6 Accessories Available 1–6 2 Probing Probing 2–2 Probing System Description 2–4 Probing Accessories 2–6 Probing Considerations 2–9 Orientation Between Probe Tip and Interface 2–10 3 The Format Menu Synchronous State Acquisition Mode 3–3 Conventional Timing Acquisition Mode 3–4 Select Clock Field (State Only) 3–5...
  • Page 7 Contents Pre-defined Trigger Macros 4–9 Using Macros to Create a Trigger Specification 4–11 Timing Trigger Macro Library 4–12 State Trigger Macro Library 4–15 Creating a User Level 4–17 Resource Terms 4–25 Assigning Resource Term Names and Values 4–27 Label and Base fields 4–31 Acquisition Control 4–32 Trigger Position Field 4–33 Sample Period Field (Timing only) 4–34...
  • Page 8 Contents Waveform Display 6–9 Display Location Reference Line 6–10 External-Clock Indicators (State only) 6–11 Blue Bar Field 6–12 Channel Mode Field 6–14 Module and Label Fields 6–16 Action Insert/Replace Field 6–17 Delete and Delete All Fields 6–18 Waveform Size Field 6–19 Sample Offset Field (State only) 6–20 Reset Statistics Field 6–20 7 The Compare Menu...
  • Page 9 Contents 9 Markers and Stop Measurements Markers Field 9–3 Pattern Markers 9–4 Find X-pattern / O-pattern Field (Listing and Chart) 9–5 Occurrence Counter Field (Listing and Chart) 9–5 From Trigger / Start / X Marker Field 9–6 X-pat / O-pat Occurrence Fields (Waveform menu) 9–7 Center Screen Field (Waveform and Chart) 9–7 X to O Display Field (Waveform and Chart) 9–7 Specify Patterns Field 9–8...
  • Page 10 Contents 11 Error Messages Error Messages 11–3 Warning Messages 11–4 Advisory Messages 11–7 Skew Adjust and Performance Verification Messages 11–8 12 Specifications and Characteristics Specifications 12–3 Characteristics 12–4 13 Installation and Service To Inspect the Module 13–3 To Prepare the Mainframe 13–3 To Configure a One-card Module 13–5 To Configure a Multi-card Module 13–5 To Install the Module 13–7...
  • Page 11 Contents–6...
  • Page 12 General Information...
  • Page 13 The 16517A/18A analyzer can be configured in the following ways: • The 16517A master can run as a single-card module or have up to four 16518A expansion cards added for a multi-card module. • Channel width varies from 16 channels on the 16517A master, up to 80 channels when four 16518A expansion cards are added.
  • Page 14 General Information Not only can you sample at the external clock transitions, but you can set the analyzer to oversample, in powers of two, up to 32x, or, up to a maximum of 2 GHz sample rate. Each point of oversampling is precisely distributed evenly within the external clock period.

  • Page 15: General Information User Interface

    General Information User Interface User Interface The Agilent Technologies 16500 Logic Analysis System has four easy-to-use user interface devices: the knob, the touchscreen, the optional mouse (standard in the 16500C), and the optional keyboard. The knob on the front panel is used to move the cursor on certain menus, to increment or decrement numeric fields, and to roll the display.

  • Page 16: Configuration Capabilities

    Configuration Capabilities The logic analyzer can be configured as a single- or multi-card module. The number of data channels range from 16 channels using just the 16517A, up to 80 channels when four 16518A expansion cards are connected. A half-channel acquisition mode is available which reduces the channel width by half, but doubles memory depth from 64 Kbits to 128 Kbits per channel.

  • Page 17: Accessories Supplied

    Accessories Supplied The table below lists the accessories supplied with your logic analyzer. If any of these accessories are missing, contact your nearest Agilent Technologies sales office. If you need additional accessories, refer to Accessories for Agilent Logic Analyzers .

  • Page 18: Probing

    Probing...
  • Page 19 Probing This chapter describes the probing system used by the 16517A/18A logic analyzer. It also contains information about the probing accessories, how to connect them to the probing system, and how to connect the probing system to the target system.
  • Page 20 The optional SMA adapter allows you to connect the individual probes to SMA cables. Microprocessor and Bus Specific Interfaces The 16517A/18A does not support inverse assembly. In addition, the 16517A/18A requires that any preprocessor used be a non- terminated preprocessor. The analyzer requires a clear connection with no termination.

  • Page 21: Probing System Description

    Probing Probing System Description Probing System Description The analyzer probing system consists of shielded cables connected to the analyzer card on one end, and a pod housing on the other. From the pod housing, connection to the target system is through 12-inch coaxial cables connected to the assorted probing accessories at the signal end.
  • Page 22 Probe Accessories Kit. The use of these probing accessories is described later in this chapter. Other probe system specifics are listed as follows: 16517A Master Card Cables Shielded, 6-foot long, contain eighteen 50-Ω transmission lines and 6 standard wires for assorted dc functions.

  • Page 23: Probing Accessories

    Probing Probing Accessories Probing Accessories The probe accessories described below are part of the probe Accessory Kits supplied with the master and expander cards. To order any of these accessories individually, use the part numbers listed below or in the Accessory Kit box.
  • Page 24 Probing Probing Accessories Signal Leads The following probing components connect the system to the signal. Probe Pin The probe pin allows touch probing. Probe pin kit 16517-82107 Qty 4 SMT Tack-on Signal/Ground Wire For surface mount components, PGAs, or cramped areas, this wire can be tacked onto an IC lead for direct connection.
  • Page 25 16517-63201 BNC to SMB Cable Adapter On the back of the 16517A master card there are two SMB connectors used for external ECL arm in/out signals. Use this adapter between the BNC cable and the analyzer. The adapter cable is only included in the Accessory Kit for the master card.

  • Page 26: Probing Considerations

    Probing Considerations There are two concerns involved in all probing situations. The first concern is probe loading of the target system. The 16517A/18A probes are designed to eliminate this problem by providing high impedance from dc to 1 GHz. The second concern is possible inconsistent or erroneous data capture caused by lead length and improper signal and ground connections.

  • Page 27: Orientation Between Probe Tip And Interface

    Probing Orientation Between Probe Tip and Interface Orientation Between Probe Tip and Interface If you find that after all the probe connections are made, you want to track or reference a connection from the target system through the probing system into the Format menu, use the following points of identification.
  • Page 28 Probing Orientation Between Probe Tip and Interface After the pod is identified, use the Activity Indicators and the Channel Reference line in the Format menu to verify activity on the data or clock channel you are referencing. Indicators show high, low, or transitional activity while no data acquisition is in process.
  • Page 29 2–12...

  • Page 30: The Format Menu

    The Format Menu...
  • Page 31 The Format Menu The Format menu is used to assign which data channels are measured and to group them under specific labels by function or by other identification needs. For your convenience in recognizing bit pattern groupings, you can also specify symbols to represent them. Within the Format menu you select the acquisition mode, which in turn sets the clock source (internal or external), memory depth, and maximum sampling speed.

  • Page 32: Synchronous State Acquisition Mode

    The Format Menu Synchronous State Acquisition Mode Synchronous State Acquisition Mode The Acquisition Mode field is used to select the acquisition mode. The acquisition mode configures which clock source is used, the channel width, memory depth, and maximum sampling speed. State Mode Full Channel 1 GHz In State Mode Full Channel 1 GHz, both pods are available on all configured cards.

  • Page 33: Conventional Timing Acquisition Mode

    The Format Menu Conventional Timing Acquisition Mode Conventional Timing Acquisition Mode The Acquisition Mode field is used to select the acquisition mode. The acquisition mode configures which clock source is used, the channel width, memory depth, and sampling speed. Timing Mode Full Channel 2 GHz In Timing Mode Full Channel 2 GHz, both pods are available on all configured cards.

  • Page 34: Select Clock Field (State Only)

    The Format Menu Select Clock Field (State Only) Select Clock Field (State Only) In the State Acquisition mode, the external clock is connected through pod one on the master card. The Select Clock field accesses a selection pop-up from which you select the edge. The edge choices are either rising or falling. Select clock field Clock and Edge Selection 3–5...

  • Page 35: Set Sample Offset Field (State Only)

    The Format Menu Set Sample Offset Field (State Only) Set Sample Offset Field (State Only) The Set Sample Offset field is used to shift the point at which samples are taken with respect to the external clock edge. The Format menu is the only place where this adjustment is available.
  • Page 36 The Format Menu Set Sample Offset Field (State Only) Fine When the Sample Offset Mode field is selected, it toggles from Coarse to Fine, and an additional Fine Adjust field becomes available. Use this field to select each individual pod, or All pods adjusted together. Fine Adjustment Fields In the Fine mode, you can offset the sample point of individual pods an additional 250 ps from the point of course adjustment within the 5 ns range.

  • Page 37: Pod Threshold Field

    The Format Menu Pod Threshold Field Pod Threshold Field The pod threshold field is used to set a voltage level which the data must cross before the analyzer recognizes and displays it as a change in logic levels. You specify a threshold level for each pod. The level specified for the master pod, which includes the clock, is also assigned to the clock.

  • Page 38: Label Polarity Fields

    The Format Menu Label Polarity Fields Label Polarity Fields The Label Polarity fields are used to assign a polarity to each label. The default polarity for all labels is positive ( + ). You change the label polarity by selecting the polarity field, which toggles the polarity between positive ( + ) and negative ( −...

  • Page 39: Bit Assignment Fields

    The Format Menu Bit Assignment Fields Bit Assignment Fields The bit assignment fields are used to assign bits (channels) to labels. The convention for bit assignment is as follows: • * (asterisk) indicates assigned bit. • . (period) indicates unassigned bit. To change a bit assignment, select the bit assignment field and move the cursor to the bit you want to change, then select an asterisk or a period.
  • Page 40 The Format Menu Bit Assignment Fields Labels may have from 1 to 32 channels assigned to them. If you try to assign more than 32 channels to a label, the logic analyzer will beep, indicating an error, and a message will appear at the top of the screen telling you that 32 channels per label is the maximum.

  • Page 41: Activity Indicators

    See Also "Symbols Assignment" chapter in the Common Module Operations section of the Agilent Technologies 16500 Logic Analysis User’s Reference for complete information on assigning symbols. 3–12...

  • Page 42: The Trigger Menu

    The Trigger Menu...
  • Page 43 The Trigger Menu The Trigger menu is used to configure when the analyzer triggers, and what the analyzer triggers on. In addition, within the Acquisition Control function, prestore and poststore requirements are set. The Trigger menu is divided into three areas, each dealing with a different area of general operation.
  • Page 44 The Trigger Menu Sequence Levels The sequence levels area is where you view the sequence levels currently used in the trigger specification. From this area you can also access each individual level for trigger modifications. Resource Terms The resource terms area is where you assign values to the user-definable resource terms.

  • Page 45: Trigger Sequence Levels

    Trigger Sequence Levels Sequence levels control when the analyzer triggers, what the analyzer triggers on, and where trigger is located in the collected data. By using sequence levels, you can create a sequence of instructions for the analyzer to follow. As the sequence levels are executed by the analyzer, all subsequent branching and sequence flow is directed by the statements within the sequence levels.
  • Page 46 The Trigger Menu Editing Sequence Levels Since constructing a trigger specification may be an iterative process, editing sequence levels may become the same kind of iterative process. The higher level editing, such as adding or deleting entire sequence levels, is done using the Modify Trigger field in the main Trigger menu.

  • Page 47: Modify Trigger Field

    The Trigger Menu Modify Trigger Field Modify Trigger Field The Modify Trigger field accesses a selection menu with choices that allow you to modify the statements of any single sequence level. In addition, other high level actions can be accessed, like global clearing of existing trigger statements, and adding or deleting sequence levels.
  • Page 48 The Trigger Menu Modify Trigger Field Delete Sequence Level If there is more than one sequence level assigned, you are asked which level to delete. Add Sequence Level By default you have one sequence level available at power up. When you add sequence levels, you are given the choice of inserting them before or after a sequence level.
  • Page 49 The Trigger Menu Modify Trigger Field Break Down Macros / Restore Macros When a macro is broken down, the contents of that macro are displayed in long form used in a user-defined sequence type. If the macro uses two internal levels, both levels are separated out and displayed in the sequence level area of the Trigger menu.

  • Page 50: Pre-Defined Trigger Macros

    Pre-defined Trigger Macros Both the state and timing acquisition modes have a macro library containing predefined trigger macros. Depending on which acquisition mode you are using, you get the corresponding library. Each macro will require at least one sequence level, and in some cases, may require multiple levels.
  • Page 51 The Trigger Menu Modify Trigger Field State Trigger Macro Library: • User Mode (user-defined macro) • Basic Macros • Sequence Dependent Macros • Time Violation Macros • Delay Macros State Trigger Macro Library 4–10...

  • Page 52: Using Macros To Create A Trigger Specification

    The Trigger Menu Using Macros to Create a Trigger Specification Using Macros to Create a Trigger Specification To configure a trigger specification using trigger macros, follow the procedure below. From the Trigger menu, enter the desired sequence level through the Modify Trigger field, or by selecting a sequence level number.

  • Page 53: Timing Trigger Macro Library

    The Trigger Menu Timing Trigger Macro Library Timing Trigger Macro Library The following list contains all the macros in the Timing Trigger Macro Library. They are listed in the same order as they appear onscreen. User Mode User level - custom combinations, loops The User level is a user-definable level.
  • Page 54 The Trigger Menu Timing Trigger Macro Library 6. Find Nth occurrence of an edge This macro becomes true when it finds the designated occurrence of a designated edge. It uses one internal sequence level. The 500 MHz trigger sequencer may not count edges captured closer than 2 ns apart. Pattern/Edge 1.
  • Page 55 The Trigger Menu Timing Trigger Macro Library Time Violations 1. Find two edges too close together This macro becomes true when a second selected edge is seen occurring within a designated period of time after the occurrence of a first selected edge.

  • Page 56: State Trigger Macro Library

    The Trigger Menu State Trigger Macro Library State Trigger Macro Library The following list contains all the macros in the State Trigger Macro Library. They are listed in the same order as they appear onscreen. User Mode User level - custom combinations, loops The User level is a user-definable level.
  • Page 57 The Trigger Menu State Trigger Macro Library 2. Find too few states between pattern 1 and pattern 2. This macro becomes true when a designated pattern 1 is seen, followed by a designated pattern 2, and with less than a selected number of states occurring between the two patterns.

  • Page 58: Creating A User Level

    The Trigger Menu Creating a User Level Creating a User Level Before you begin to program a trigger specification using user-defined sequence levels, consider that in most cases one of the trigger macros will work. A trigger macro library is available with pre-defined sequence statements already built for you.
  • Page 59 The Trigger Menu Creating a User Level The steps in this kind of process are difficult to predict, but the general approach is to think of each sequence level as an opportunity to direct the analyzer’s selection process in the desired direction. During sequence execution, the analyzer searches for a match between the resource term value and the measurement data.
  • Page 60 The Trigger Menu Creating a User Level Using Bit Patterns and Edges Bit patterns and edges can be used by themselves or in combination. Bit patterns are set to match specific data values, and in the timing acquisition mode, edges are set to match specific edges of a timing pulse. Example The following statement looks for the bit pattern you assigned to the term patt1 to occur 2 times, before it branches to sequence level 3:...
  • Page 61 The Trigger Menu Creating a User Level Setting Pattern Durations (Timing only) When a bit pattern is found during a timing sequence evaluation, you can influence when the term actually becomes "true" by assigning a time duration. This works very similar to how the occurrence counter influences terms.
  • Page 62 The Trigger Menu Creating a User Level Until exit/Upon entry/ Present/Absent field Upon exit field < > field Duration Assignment Menu Present/Absent Field This field determines whether the resource becomes true when the bit pattern is present or absent for the specified time interval.
  • Page 63 The Trigger Menu Creating a User Level Using the Timer The timer is started as the sequence level is entered. If you return to the same sequence level again, the timer will be restarted. If you choose to use the timer in a sequence level, the occurrence counter is not available in that level.
  • Page 64 The Trigger Menu Creating a User Level Using the Occurrence Counters The occurrence counter is assigned to either the "Find" branch or the "else on" branch. Whatever positive number you assign to the counter, the pattern must be seen that number of times before the term becomes true. It should be noted that in order to count occurrences of a pattern with a >...
  • Page 65 The Trigger Menu Creating a User Level Branching Each of the four sequence levels has one primary branch and one secondary branch. If the primary branch is taken, the destination is directed by the "Find" statement. If the secondary branch is taken, the destination is directed by the "else on"...

  • Page 66: Resource Terms

    Resource Terms The analyzer has four resources and one timer/counter. The four resources can be represented by up to six resource term names, patt1−patt4 bit patterns, and edges 1−2 (timing only). The pattern and edge terms are used in any of the four sequence levels. Once you assign the four resources with both a resource term name and a value, the resources can be used either by themselves or in combination with each other.
  • Page 67 The Trigger Menu Creating a User Level Bit Patterns Terms patt1−patt4 Bit patterns with default names patt1− patt4 are available to use for any of the four resources. Bit pattern resource terms are set to match the numeric value or bit pattern of a group of data channels. All bits of the pattern that are not defined as Don’t Cares (x) must match the input data in order for a pattern to be present.

  • Page 68: Assigning Resource Term Names And Values

    The Trigger Menu Assigning Resource Term Names and Values Assigning Resource Term Names and Values The Terms field identifies the list of available resource term names within the analyzer. The resource term names (patt1 − patt4, edge1, edge2) are default names and can be changed if desired.
  • Page 69 The Trigger Menu Assigning Resource Term Names and Values Setting Bit Pattern Values Just to the right of the term name fields are the term assignment fields. When any of the individual assignment fields are selected, a keypad appears. Use this keypad to assign values or Don’t Cares (x). Edge Terms 1 and 2 If you want to qualify an edge, place the appropriate edge on the data channel you are watching.
  • Page 70 The Trigger Menu Assigning Resource Term Names and Values Timer Term Timer options are selected from within sequence levels. The timer term is evaluated as either true or false. A true timer term lets the sequence evaluation continue within the current statement. Because the timer works exclusively for each level it is assigned to, it will not affect any other level or the trigger specification from a global respect.
  • Page 71 The Trigger Menu Assigning Resource Term Names and Values patt1 patt2 patt3 Combination patt4 Term edge1 edge2 Timer_expired Combination Term Choices Logical operators are configured into the chain by selecting the logical operation field. They will toggle to another choice, or, a selection list will appear.

  • Page 72: Label And Base Fields

    See Also "Labels Assignment" chapter, in the Common Modules Operations section of the Agilent Technologies 16500/16501A Logic Analysis System User’s Reference. Base Field All assigned labels will have a base field. If the numeric base is changed in a menu, the base in other menus may not change accordingly.

  • Page 73: Acquisition Control

    Acquisition Control The Acquisition Control menu is used to set the acquisition mode, the trigger position within available memory, and the sample period. Acquisition Mode Field The Acquisition Mode field toggles between Manual and Automatic. When set to Automatic, the trigger position and sample period are computed based on the sec/Div and delay settings in the Waveform menu.

  • Page 74: Trigger Position Field

    The Trigger Menu Trigger Position Field Trigger Position Field The Trigger Position field accesses a selection menu with the options of Start, Center, End, User Defined, or Delay. When an option is selected, that point of the available memory is positioned relative to the trigger. A representation of this is shown by the blue graphic bar with the "Trig"...

  • Page 75: Sample Period Field (Timing Only)

    The Trigger Menu Sample Period Field (Timing only) Sample Period Field (Timing only) The Sample Period field is used to set the time period between data samples. Every time a new sample is taken, the analyzer will see updated measurement data. In full-channel mode, the sample period is configurable.
  • Page 76 The Trigger Menu Samples/Clock Field(State only) If at any time while configuring a measurement you notice some of the higher oversampling rate choices not available, this means those choices would have exceeded the 2 GHz sampling rate when multiplied by the external clock rate.
  • Page 77 The Trigger Menu Samples/Clock Field(State only) The figure below shows data at the external clock transitions, data at the points of oversampling, and the data points where the analyzer could trigger. Oversampled points External clock transitions are indicated by arrows Trigger points are on external-clock transitions only...

  • Page 78: Armed By Field

    See Also "Intermodule Measurements" chapter in the Agilent Technologies 16500B User’s Reference or "Correlating Measurements" chapter in the Agilent Technologies 16500C User’s Reference for information on making a measurement using other modules through the IMB.
  • Page 79 4–38...

  • Page 80: The Listing Menu

    The Listing Menu...
  • Page 81 The Listing Menu The Listing menu is a display menu for the acquired data in either the state or timing acquisition modes. The acquired data is displayed in the order the analyzer placed the data into memory. Data is grouped and displayed by label and in a selectable base.

  • Page 82: Markers Field

    The Listing Menu Markers Field Markers Field The Markers field may appear in different locations depending on the menu you are in. Regardless of its location, the Markers field is always used to access a marker selection menu. See Also "Markers and Stop Measurements"...

  • Page 83: Label And Base Fields

    The Listing Menu Label and Base Fields Label and Base Fields The Label and Base fields show up together in all menus except the Format and Configuration menus. When a new label is assigned, a base field is automatically assigned to that label. Label Field Labels in the Listing menu are the same labels assigned in the Format menu.

  • Page 84: Show States All/Ext Clock (State Only)

    The Listing Menu Show States All/Ext Clock (State only) Show States All/Ext Clock (State only) The Show States field only appears in the state acquisition mode and only when an oversampling value is set. The field toggles between All and Ext Clk. See Also "Samples/Clocks Field"...

  • Page 85: Sample Offset Field (State Only)

    The Listing Menu Sample Offset Field (State only) Sample Offset Field (State only) The Sample Offset field only appears in the state acquisition mode, and when the markers are turned off. Use it to offset the sample clock with respect to the external clock edge. The Sample Offset field moves the sample point closer to the start point of valid data.

  • Page 86: The Waveform Menu

    The Waveform Menu...
  • Page 87 The Waveform Menu The Waveform menu is one of the analyzer display menus. You use the Waveform menu to view data captured in either state or timing acquisition modes and in a format similar to an oscilloscope display. Data is displayed with the horizontal axis representing time, and the vertical axis representing logic highs and lows.

  • Page 88: Acquisition Control Field

    The Waveform Menu Acquisition Control Field Acquisition Control Field The function of the Acquisition Control field in the Waveform menu is the same as in the Trigger menu. See Also The "Acquisition Control Field" in the Trigger menu for complete details. Acquisition control field Acquisition control menu...

  • Page 89: Accumulate Field

    The Waveform Menu Accumulate Field Accumulate Field The Accumulate field controls whether old data is cleared or displayed with new data. The Accumulate field will toggle On/Off. When Accumulate is on, the analyzer displays the data from a current acquisition on top of the previously acquired data.

  • Page 90: Seconds Per Division Field

    The Waveform Menu Seconds Per Division Field Seconds Per Division Field Use the sec/Div field to select the seconds per division resolution. The range of the sec/Div field is 250 ps/Div to 50 s/Div. You set the sec/Div field by either selecting the sec/Div field and rotating the knob, or by selecting the sec/Div field twice, and then using the pop-up keypad.

  • Page 91: Delay Field

    The Waveform Menu Delay Field Delay Field The Delay field allows you to scroll the data and place the desired section at center screen. Changing the delay will not effect the data acquisition unless it is a timing analyzer and the acquisition mode is Automatic mode. The delay range of a timing display is from −2500 seconds to + 2500 seconds.

  • Page 92: Sample Period Display (Timing Only) External Clock Period Display (State Only)

    The Waveform Menu Sample Period Display (Timing only) External Clock Period Display (State only) Sample Period Display (Timing only) External Clock Period Display (State only) The Sample period display only appears in the timing acquisition mode. A sample period is the interval of time between new data samples. Every time a new acquisition is taken, the analyzer updates the measurement.

  • Page 93: Markers Field

    The Waveform Menu Markers Field Sample Points The External Clock Period display only appears in the state acquisition mode. The clock period display shows the speed of the clock from the target system. Also displayed is the Samples/External Clock which shows how many samples are taken per external clock cycle.

  • Page 94: Waveform Display

    "Intermodule Measurements" chapter in the Agilent Technologies 16500B Logic Analysis System User’s Reference or "Correlating Measurements" in the Agilent Technologies 16500C Logic Analysis System User’s Reference for more information on mixed displays and Group Run. The waveform display area also accesses the fields used to select, delete, or modify waveforms.

  • Page 95: Display Location Reference Line

    The Waveform Menu Display Location Reference Line Display Location Reference Line At the bottom of the Waveform menu is a reference line that displays the relative location of the display window with reference to the total memory. Total memory is represented by a horizontal dotted line. The display window is represented by the overlaid solid line.

  • Page 96: External-Clock Indicators (State Only)

    The Waveform Menu External-Clock Indicators (State only) External-Clock Indicators (State only) When oversampling has an assigned value greater than 1, tick marks are displayed at the top of the display showing where the external-clock transitions occur in reference to the displayed waveforms. See Also "Samples/Clock Field"...

  • Page 97: Blue Bar Field

    The Waveform Menu Blue Bar Field Blue Bar Field The blue bar on the left side of the waveform display is both a display and configuration field. After all desired waveforms are configured for display, they are listed in the blue bar. If there are more waveforms than can be displayed, the list is scrolled by selecting the dark blue bar.
  • Page 98 The Waveform Menu Blue Bar Field When the Waveform Selection pop-up menu appears, you select which waveforms are displayed, replaced, or modified. You can display up to 24 waveforms on screen at one time. Single waveforms or all waveforms under a label can be displayed or turned off.

  • Page 99: Channel Mode Field

    The Waveform Menu Channel Mode Field Channel Mode Field The Channel Mode field selects which method is used to insert the waveform labels into the display. All inserted labels are placed below the cursor in the blue bar field. When the Channel Mode field is selected, a selection menu appears with the choices below.
  • Page 100 The Waveform Menu Channel Mode Field Overlay The Overlay mode inserts all bits of a label in a single waveform to form a composite waveform label. The onscreen indication for the Overlay mode is "All" following the label name. Viewing State Data in Overlay Mode When all assigned waveforms in a label are overlaid, the value of the data is displayed to the right of each new transition in the waveform display.

  • Page 101: Module And Label Fields

    The Waveform Menu Module and Label Fields Module and Label Fields If there are multiple analyzers or oscilloscope modules installed in the mainframe, waveforms from the other modules can be displayed in the waveform menu. The Module field accesses a selection list that contains the modules installed in the mainframe, that are configured in a Group Run, and have timing or oscilloscope waveforms.

  • Page 102: Action Insert/Replace Field

    The Waveform Menu Action Insert/Replace Field Action Insert/Replace Field The Action field determines if a label or channel is inserted into the display or replaces another label or channel. Insert will append the selected label or channel to the position of the cursor. Up to 96 waveforms can be displayed at a time.

  • Page 103: Delete And Delete All Fields

    The Waveform Menu Delete and Delete All Fields Delete and Delete All Fields The Delete field is used to delete single channels within the group of displayed waveforms. To delete any single channel, you first highlight the desired channel by placing the cursor on the channel, then select the Delete field.

  • Page 104: Waveform Size Field

    The Waveform Menu Waveform Size Field Waveform Size Field The Waveform Size field accesses a selection menu which contains choices that scale the displayed waveforms to different sizes. A different waveform size can increase the number of waveforms in the display or can make the viewing better for just a few.

  • Page 105: Sample Offset Field (State Only)

    The Waveform Menu Sample Offset Field (State only) Sample Offset Field (State only) The Sample Offset field only appears in the state acquisition mode, and when the markers are turned off. Use it to offset the sample clock with respect to the external clock edge. The Sample Offset field moves the sample point relative to the clock edge.

  • Page 106: The Compare Menu

    The Compare Menu...
  • Page 107 The Compare Menu Compare is a software post-processing feature that provides the ability to do a bit-by-bit comparison between the acquired data listing and a reference listing. The comparison between the acquired listing data and the data in the reference listing is done relative to the trigger points. This means that the two data records are aligned at the trigger points and then compared bit by bit.
  • Page 108 The Compare Menu Compare Post-Processing Features You can view the acquired data, your reference listing, and a listing that highlights the bits that do not match the bits in the reference listing in separate listings. You can edit the reference listing for unique comparisons.

  • Page 109: Reference Listing Field

    The Compare Menu Reference Listing Field Reference Listing Field The Reference listing/Difference listing field is a toggle field that switches the listing type between the Reference image listing and the Difference listing. The Reference listing is a display of the image (also known as a template) that acquired data is compared to.

  • Page 110: Difference Listing Field

    The Compare Menu Difference Listing Field Difference Listing Field The Reference listing/Difference listing field is a toggle field that switches the listing type between the Reference image listing and the Difference listing. The Difference listing is a display of the acquired data listing. Data that is different from the Reference listing is highlighted with inverse video.
  • Page 111 The Compare Menu Difference Listing Field The controls that roll the listing in all three menus — the normal state listing, the Reference listing, and the Difference listing — are synchronized, unless the number of pretrigger states differs between the Reference listing and the acquired data.

  • Page 112: Copy Listing To Reference Field

    The Compare Menu Copy Listing to Reference Field Copy Listing to Reference Field The initial Reference image is generated either by copying the data listing from the Listing menu or by loading an analyzer configuration file which contains a Reference listing. If you load an analyzer configuration to get a Reference image, the other menu setups will change.

  • Page 113: Find Error Field

    The Compare Menu Find Error Field Find Error Field The Find Error field allows you to easily locate any data that did not match in the last comparison. Occurrences of differences, or errors, are found in numerical ascending order from the start of the listing. The first occurrence of an error has the numerical value of one.

  • Page 114: Compare Full / Compare Partial Field

    The Compare Menu Compare Full / Compare Partial Field Compare Full / Compare Partial Field The Compare Full/Compare Partial field is a toggle field that allows you to compare either the full range of states or define a subset of the total number of states in the Reference image for use in the comparison.

  • Page 115: Mask Field

    The Compare Menu Mask Field Mask Field The channel masking field is used to specify the bits in each label that you do not want compared. This causes the corresponding bits in all states to be ignored in the comparison. The Reference data image itself remains unchanged on the display.

  • Page 116: Specify Stop Measurement Field

    The Compare Menu Specify Stop Measurement Field Specify Stop Measurement Field The Stop Measurement function allows you to specify a condition which stops the analyzer measurement during a repetitive run. When the Specify Stop Measurement field is selected, a Stop Measurement menu appears which is used to set the stop criteria.
  • Page 117 The Compare Menu Specify Stop Measurement Field Compare When Compare is selected, a repetitive run is stopped when a comparison of data in the Listing menu and data and criteria in a Reference image matches an Equal/Not Equal selection. The equality selection is set from the Equal/Not Equal selection pop-up menu.
  • Page 118 The Compare Menu Specify Stop Measurement Field When X-O is selected, a repetitive run is stopped when a comparison of the time period between the X and O pattern markers and one of the following time period options is true. Less Than X-O time must be less than the time value that you specify in the Time field.

  • Page 119: Data Roll Field

    The Compare Menu Data Roll Field Data Roll Field The column of numbers at the far left represents the location of the acquired data in the state analyzer’s memory. The numbered positions are also known as the state locations and are relative to the trigger state location, which is always represented by 0.

  • Page 120: Bit Editing Field

    The Compare Menu Bit Editing Field Bit Editing Field The bit editing fields are located in the center of the Reference listing display. A bit editing field exists for every label in the display unless the label’s base is ASCII. Bit editing fields allow you to modify the values of individual bits in the Reference image or to specify them as don’t compare bits.

  • Page 121: Label And Base Fields

    Octal, Decimal, Hex, ASCII, Symbol, and Two’s complement. See Also The "Labels Assignment" chapter in the Common Module Operations section in the Agilent Technologies 16500 Logic Analysis System User’s Reference for more information on assigning labels and rolling labels. 7–16...

  • Page 122: The Chart Menu

    The Chart Menu...
  • Page 123 The Chart Menu Chart is a software post-processing feature that provides the ability to build X-Y graphs of label activity using state data. The Y axis of the Chart menu always represents data values for a specified label. You can select whether the X axis represents states (rows in the Listing menu) or the data values for another label.
  • Page 124 The Chart Menu Label Versus Label Charts When labels are assigned to both axes, the chart shows how one label varies in relation to the other for a particular trace record. Label values are always plotted in ascending order from the bottom to the top of the chart and in ascending order from left to right across the chart.

  • Page 125: The Y Markers

    The Chart Menu The Y Markers The Y Markers Y1 and Y2 Fields The Y1 and Y2 markers are used for rescaling data on the vertical axis. Assigning values to these fields can be accomplished in either of two ways. When the field is selected the first time, it turns light blue and operating the knob changes the Y marker value.

  • Page 126: Markers Field

    The Chart Menu Markers Field Markers Field The Markers field is used to access the markers selection pop-up. When the Markers field is selected, a marker selection pop-up menu appears. The choices are Sample (the default), Pattern, Time, and Statistics. Sample markers are explained in more detail in the following section;...

  • Page 127: Rescale

    The Chart Menu Rescale X1 and X2 Fields (Markers Sample mode only) The X1 and X2 markers are used for displaying and rescaling specific data values. Assigning values to these fields can be accomplished in either of two ways. When the field is selected the first time, it turns light blue and operating the knob changes the value.
  • Page 128 The Chart Menu Rescale Rescale field Rescale Field Between X&Y axis markers This selection will execute both X and Y markers operations as discussed above, resulting in the rescaling of both the horizontal and vertical axes. Full Scale This selection rescales the horizontal and vertical axes so that all data samples are charted in the XY display area.

  • Page 129: Axis Control Field

    The Chart Menu Axis Control Field Axis Control Field Touching the Axis Control field causes a pop-up menu, Chart Axis Control, to appear. In this menu, you specify the relation to be charted and the boundaries for the chart. The vertical Y axis will always be a label. The available labels are those which you defined in the Format menu.
  • Page 130 The Chart Menu Axis Control Field "vs." State/Label Field (X axis) The X axis can represent a label’s value or location in the sample. The X axis assignment field is just to the right of "vs.", and toggles between State and Label.
  • Page 131 The Chart Menu Axis Control Field When plotting Label versus Label, both the Y axis and the X axis can be scaled. Charted memory locations are selectable in the "Plot from State" field for the X axis. X axis fields Y axis fields Axes Scaling Fields 8–10...

  • Page 132: Accumulate Field

    The Chart Menu Accumulate Field Accumulate Field The Accumulate field may be toggled between off and on. When Accumulate On is selected, data from multiple acquisitions are charted on top of one another. When Accumulate Off is selected, only the current acquisition is displayed.
  • Page 133 8–12...

  • Page 134: Markers And Stop Measurements

    Markers and Stop Measurements...
  • Page 135 Markers and Stop Measurements Marker and stop measurement functions are available in the Listing, Waveform, and Chart menus. Stop measurement is also available in the Compare menu. In each menu, the operation of these functions are very similar. In this chapter you will find field and feature definitions for both the markers and the stop measurement functions for all menus.

  • Page 136: Markers Field

    Markers and Stop Measurements Markers Field Markers Field The Markers field may appear in different locations depending on the menu you are in. Regardless of its location, the Markers field is always used to access a marker selection menu. Markers Off/Sample Pattern Time...

  • Page 137: Pattern Markers

    Pattern Markers When Pattern markers are selected, two markers labeled X and O become available. Pattern markers identify and mark unique bit patterns in the display. Once the unique bit patterns are specified, they can be used as reference points or as criteria for a stop measurement.

  • Page 138: Find X-Pattern / O-Pattern Field (Listing And Chart)

    Markers and Stop Measurements Find X-pattern / O-pattern Field (Listing and Chart) Find X-pattern / O-pattern Field (Listing and Chart) The Find X-pattern / O-pattern field is a toggle field which is used to select the X or O marker for setup. The marker specifications set in the Occurrence field and the From Trigger / Start / X Marker field affect the pattern marker that is designated in this field.

  • Page 139: From Trigger / Start / X Marker Field

    Markers and Stop Measurements From Trigger / Start / X Marker Field From Trigger / Start / X Marker Field The from Trigger/Start/X marker field accesses a selection pop-up for the search start point of the X and O markers. The start points available for the green X marker are either the beginning of the trace or the trigger point.

  • Page 140: X-Pat / O-Pat Occurrence Fields (Waveform Menu)

    Markers and Stop Measurements X-pat / O-pat Occurrence Fields (Waveform menu) X-pat / O-pat Occurrence Fields (Waveform menu) The X-pat and O-pat occurrence fields are used to set which pattern occurrence the marker is placed on. Occurrence counter range is from −131071 to +131071.

  • Page 141: Specify Patterns Field

    Markers and Stop Measurements Specify Patterns Field Specify Patterns Field The Specify Patterns field only appears when the markers are set to Pattern. When the Specify Patterns field is selected, a pop-up menu appears that is used to assign the bit patterns for the clocked X and O markers, the X and O entering/leaving, and the Stop measurement criteria.
  • Page 142 Markers and Stop Measurements Specify Patterns Field Pattern Display Fields The pattern display fields display the alphanumeric bit pattern specified for each X and O marker in all designated labels. The bit pattern is displayed in the same numeric base as the data listing. When the pattern display field is selected, a pop-up keypad appears which is used to set the bit pattern.

  • Page 143: Stop Measurement Field

    Markers and Stop Measurements Stop Measurement Field Stop Measurement Field The Stop measurement function allows you to specify a condition that stops the analyzer measurement during a repetitive run. When the Stop measurement field is selected, a Stop measurement type menu appears.

  • Page 144: Clear Pattern Field

    Markers and Stop Measurements Clear Pattern Field Compare When Compare is selected, a repetitive run is stopped when a comparison of data in the Listing menu and masked data in the Reference listing of the Compare menu matches an equality selection. The equality selection is set from the Equal/Not Equal selection pop-up menu.

  • Page 145: Time Markers

    Time Markers Time markers are indicators located in the data listing or waveform display that are used as reference marks to obtain time values between each marker, or between each marker and the trigger point. The markers are color coded for easy recognition. The X marker is represented by a green line and the O marker is represented by a yellow line.

  • Page 146: Trig To X / Trig To O Fields

    Markers and Stop Measurements Trig to X / Trig to O Fields Trig to X / Trig to O Fields The Trig to X and Trig to O fields are display fields as well as configuration fields. Marker position is set by selecting the fields, then after the fields turn light blue, rotating the knob.

  • Page 147: Statistics Markers

    Statistics Markers After patterns are assigned to the X and O markers, statistical information becomes available when markers are set to Statistics. The logic analyzer displays the following information: • Number of valid runs (runs where Pattern markers were able to be placed on specified patterns).

  • Page 148: Reset Statistics Field (Waveform Menu)

    Markers and Stop Measurements Reset Statistics Field (Waveform menu) Reset Statistics Field (Waveform menu) The Reset Statistics field only appears in the Waveform menu, and when using Statistics Markers. It is used to clear all statistic displays, and reset them to zeros. Clear Statistics Field (Chart menu) The Clear Statistics field only appears in the Chart menu, and when using Statistics Markers.
  • Page 149 9–16...

  • Page 150: Skew Adjust

    Skew Adjust...

  • Page 151: To Calibrate The Data Acquisition Module

    RAM, and are loaded up at system start up. To periodically verify the performance of the 16517A/18A against the module specifications, refer to "Testing Performance" in the optional Agilent Technologies 16517A/18A Service Guide, available from your Agilent Technologies Sales Office.

  • Page 152: To Adjust The Channel-To-Channel Skew

    Connect the Logic Analyzer Connect one end of the BNC cable to the calibration output port on the rear panel of the 16517A master board. Connect the other end of the BNC cable to the BNC Signal Input of the calibration module.

  • Page 153: Set Up The Logic Analyzer

    Skew Adjust Set Up the Logic Analyzer Set Up the Logic Analyzer Go to the Skew Adjust menu. In the System Configuration menu, touch System, and select 4GHz/1GHz LA from the pop-up menu. Touch Format. In the pop-up menu, touch Skew Adjust. In the Skew Adjust menu, select Adjust Clock and Data Path Deskew.
  • Page 154 Skew Adjust Set Up the Logic Analyzer Follow the instructions on the screen to connect the pods to the calibration module. After connecting the pod to the calibration module, touch Proceed. Proceed field Adjust Clock and Data Path Skew Menu Continue following the instructions on the screen to connect the various pods to the calibration module until all pods are skew adjusted.

  • Page 155: To Save Or Discard The Skew Factors

    Skew Adjust To Save or Discard the Skew Factors To Save or Discard the Skew Factors When the skew adjustment is complete, the choice is given to save or not save the skew factors. To not save the skew factors, touch Do NOT Save Skew Factors.

  • Page 156: Error Messages

    Error Messages...
  • Page 157 For more information If any messages are encountered while running Self Tests, refer to the optional Agilent Technologies 16517A/18A Service Guide for information on test descriptions and troubleshooting procedures. You can order the Service Guide through your Agilent Technologies Sales Office. 11–2...
  • Page 158 Failure to Read Skew Values from Flash ROM. The logic analysis system could not load skew values from ROM and is using default skew values instead. This message occurs the first time the 16517A/18A module is powered up, or if there are no skew values in the Agilent Technologies 16500 logic analysis system.

  • Page 159: Warning Messages

    Error Messages Warning Messages Selected file is incompatible The file being loaded cannot be translated into the 16517/18A. Time correlation of data is not possible. Before time correlation of data is possible, time tags must be placed on the data. If you want time correlated data, set the Count field in the Trigger menu to Time.
  • Page 160 Error Messages Warning Messages Machine name: "filename" inverse assembler not found. This message appears when the inverse assembler file could not be found. Need to have two free sequence levels. For each sequence level with a "<" assigned, you must leave two sequence levels free. To free up two levels, simply delete two levels.
  • Page 161 Error Messages Warning Messages User thresholds have been truncated. The logic analysis system is trying to translate a configuration having thresholds greater than 6 Volts or less than -6 Volts. Using Default 16517/18 Skew Values. Please See "Skew Adjust" Menu. The logic analysis system was unable to locate skew values in ROM and is using default values.

  • Page 162: Advisory Messages

    Error Messages Advisory Messages Advisory Messages Charting line: <number> The logic analysis system is redrawing the chart display. Insert failed - Maximum of 60 entries. 60 listing columns is the maximum number allowed. This advisory appears when you try to configure more than 60 columns.

  • Page 163: Skew Adjust And Performance Verification Messages

    Error Messages Skew Adjust and Performance Verification Messages Skew Adjust and Performance Verification Messages The following Error, Warning, and Advisory messages may be encountered when performing the skew adjust or performance verification testing. Error messages have a red background and indicate that the measurement, or part of the measurement, will not occur until the problem is fixed.
  • Page 164 Error Messages Skew Adjust and Performance Verification Messages Warning Messages Skew adjustment halted, recalling stored values. Calibration was halted before it completed. Skew adjustment failed, recalling stored values. This message appears when any calibration fails. Skew adjustment failed. Press "Proceed" to retry or "Exit" to quit. This message appears when any calibration fails, but only before the user retries or quits.
  • Page 165 11–10...

  • Page 166: Specifications And Characteristics Specifications

    Specifications and Characteristics...
  • Page 167 Characteristics are not specifications, but are included as additional information. For complete information on the test procedures to verify product performance, refer to the optional Agilent Technologies 16517A/18A Service Guide, available from your Agilent Technologies Sales Office. For instructions on running the self-tests, see the "Installation and Service"...
  • Page 168 Specifications and Characteristics Specifications Specifications The specifications are the performance standards against which the product is tested. They are specified for an input signal VH = −0.9V, VL = −1.7V, slew rate = 1V/ns, and threshold = −1.3V. Minimum Input Voltage Swing: 500 mV peak to peak. Threshold Accuracy: ±...

  • Page 169: Characteristics

    Specifications and Characteristics Characteristics Characteristics The characteristics are not specifications, but are included as additional information. Input DC Resistance: 100 KΩ, ± 2%. Probes Input Impedance: DC through 400 ns rise time 100 KΩ, typical. 500 Ω, typical. 3.5 ns through 350 ps 1000K 100K 500 W...
  • Page 170 Specifications and Characteristics Characteristics Input Capacitance: 0.2 pF and then, through 500 Ω, 3 pF. Probes Minimum Input Overdrive: 250 mV or 30% of input (whichever is greater) above the pod threshold. Threshold Range Increments: ±5.0 V in 10 mV increments. Threshold Setting: Preset TTL, ECL, or User-defined on a per pod basis.
  • Page 171 Specifications and Characteristics Characteristics Timing Analysis Timing Modes: Conventional timing. Timing Speed: 15.3 KSa/s − 2 GSa/s full channel, 4 GSa/s half channel. Sample Period: 500/250 ps minimum (full/half channel mode), 65.536 µs maximum. Channel Count: 16/8 per card (full/half channel mode). Minimum Detectable Pulse Width: 4 GSa/s 800 ps, typical.
  • Page 172 Specifications and Characteristics Characteristics Edge Width: 16/32/48/64/80 channels. Edge Counting Frequency: 444 MHz. Edge Detection: Up to 1 GHz. Greater than Duration (Timing only): 0 ns – 510 ns, accuracy is ± 2.25 ns. Less than Duration (Timing only): 4 ns – 510 ns, accuracy is ± 2.25 ns.
  • Page 173 Specifications and Characteristics Characteristics Measurement and Display Functions Arming: Can be armed by the Run key, the external SMB, or the Intermodule Bus (IMB). Trace Mode: Single mode acquires data once per trace specification. Repetitive mode repeats single mode acquisitions until Stop is pressed or until pattern time interval or compare stop criteria are met.
  • Page 174 Specifications and Characteristics Characteristics Statistics: X to O marker statistics are calculated for repetitive acquisitions. Patterns must be specified for both markers, and statistics are kept only when both patterns can be found in an acquisition. Statistics are minimum X to O time, maximum X to O time, average X to O time, and ratio of valid runs to total runs.
  • Page 175 Specifications and Characteristics Characteristics Accumulate: Waveform display is not erased between successive acquisitions. Overlay Mode: Multiple channels can be displayed on one waveform display line. When waveform size is set to large, the value represented by the waveforms is displayed inside the waveforms in selected base. Displayed Waveforms: 24 lines maximum on one screen.
  • Page 176 Installation and Service...
  • Page 177 Preparing for Use This chapter gives you instructions for preparing the logic analyzer module for use, and for performing periodic maintenance. Power Requirements All power supplies required for operating the logic analyzer are supplied through the backplane connector in the mainframe. Operating Environment The operating environment is listed in chapter 12.

  • Page 178: Installation And Service To Inspect The Module

    If you find any defects, contact your nearest Agilent Technologies Sales Office. Arrangements for repair or replacement are made, at Agilent Technologies’ option, without waiting for a claim settlement. To Prepare the Mainframe Turn off the mainframe power before removing, replacing, or installing the C A U T I O N module.
  • Page 179 Installation and Service To Prepare the Mainframe Starting from the top, pull the cards and filler panels that need to be moved halfway out. All multi-card modules will be cabled together. Pull these cards out together C A U T I O N to prevent damage to the cables and connectors.

  • Page 180: To Configure A One-Card Module

    To Configure a One-card Module To Configure a One-card Module • The 16517A module can be used as a one-card module. The 16518A module can not be used as a one-card module. • If you need to configure a multi-card module into a one-card module, remove the cables connecting the cards.
  • Page 181 Installation and Service To Configure a Multi-card Module • To configure a four-card module, you can have one expansion card above the master card and two below, or two expansion cards above and one below (see illustration on page 13-4). Note the cables which are used for each configuration, and the side of the master card which is used for connecting.

  • Page 182: To Install The Module

    Installation and Service To Install the Module To Install the Module Slide the cards above the slots for the module about halfway out of the mainframe. If the module consists of a single card, then slide the module approximately halfway into the mainframe. If the module consists of more than one card, then perform the following steps: Slide the card approximately three inches into the mainframe.

  • Page 183: To Test The Module

    Agilent Technologies Sales Office. • If the module does not operate correctly, go to the beginning of chapter 5, "Troubleshooting," in the optional Agilent Technologies 16517A/18A Service Guide. The Service Guide is available through your Agilent Technologies Sales Office. 13–8...

  • Page 184: To Perform The Self-Tests

    In the System Configuration menu, touch Configuration. In the pop-up menu, touch Test. If the 16517A/18A module is configured in an Agilent Technologies 16500A mainframe, the PV system disk must be installed in one of the flexible disk drives. Touch the box labeled Touch Box to Load Test System.

  • Page 185: Perform The Functional Tests

    Perform the Functional Tests Perform the Functional Tests The Functional Tests verify the main subsystems of the 16517A/18A module are functioning. The pod channels are not connected to any type of test signal for any of these tests. If a test fails, a message will appear which indicates which module board failed.

  • Page 186: Perform The Skew Adjustments And Tests

    Touch Skew Adjustments and Tests. Perform the skew adjust procedure. Touch Adjust Clock and Data Path Skew. A BNC coax cable (Agilent Technologies 10503A) and Calibration Pod (16517-63201) are needed. Follow the instructions on the display. At the end of the Skew adjust, save the skew factors to NV-RAM.

  • Page 187: Exit The Self-Tests

    Touch the 4GHz/1GHz Timing field, then touch Test System. Touch Configuration, then touch Test. If the 16517A/18A module is configured in an Agilent Technologies 16500A mainframe, the operating system disk must be installed in one of the flexible disk drives.

  • Page 188: To Return Assemblies

    • Description of service required or failure indications Remove accessories from the module. Only return accessories to Agilent Technologies if they are associated with the failure symptoms. Package the module. You can use either the original shipping containers, or order materials from an Agilent Technologies sales office.
  • Page 189 13–14...
  • Page 190 Index () field greater than, 4–21 post-processing features, 8–2 menu map, 3–3 x-axis label/state value field, 8–9 pod threshold field, 3–8 charts state acquisition mode field, 3–3 label value vs label value, 8–3 timing acquisition mode field, 3–4 accessories label value vs states, 8–3 from trigger/start/X-marker field, 9–6 available, 1–6 cleaning, 13–13...
  • Page 191 Index pattern markers, 9–4 reset statistics, 6–20, 9–15 statistics markers, 9–14 reference listing field, 7–4 statistics markers, 9–14 time markers, 9–12 reset statistics, 6–20, 9–15 stop measurement, 9–2 waveform menu, 6–8 resource terms, 4–25 stop measurement field, 9–10 markers field, 5–3, 6–8, 8–5, 9–3 assigning bit pattern values, 4–28 compare, 9–11 mask field, 7–10...
  • Page 192 Index X to O display field, 9–7 x-pattern/o-pattern occurrence field, 9–7 waveform reconstruction, 6–7 waveform size, 6–19 X to O display field, 9–13 X to O field, 9–7 X-axis label/state value field, 8–9 Index–3...
  • Page 193 Index–4...
  • Page 194 • Do not operate the Agilent Technologies shall of the instrument to the W A R N I N G instrument in the presence of not be liable for errors protective conductor of the flammable gasses or fumes.
  • Page 195 Buyer agreements and other do not expect a one-to-one shall prepay shipping charges customer assistance correspondence between to Agilent Technologies and agreements are available for product updates and manual Agilent Technologies shall Agilent Technologies updates. pay shipping charges to products.
  • Page 196 This product was tested in a typical configuration with Agilent Technologies test systems. Colorado Springs, 03/02/93 John Strathman, Quality Manager European Contact: Your local Agilent Technologies Sales and Service Office or Agilent Technologies GmbH, Department ZQ / Standards Europe, Herrenberger Strasse 130, D-71034 Böblingen Germany (FAX: +49-7031-14-3143)
  • Page 197 Product Regulations Safety IEC 348:1978 / HD 401 S1:1981 UL 1244 CSA-C22.2 No.231 (Series M-89) This Product meets the requirement of the European Communities (EC) EMC Directive 89/336/EEC. Emissions EN55011/CISPR 11 (ISM, Group 1, Class A equipment) Immunity EN50082-1 Code Notes IEC 555-2 IEC 555-3...

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